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FULL DESCRIPTION of Item 248941

in Ellipsometers

Item ID: 248941

1 Offered at Best Price

Nanometrics 8300XSE Film Thickness Analyzer

Nanometrics 8300XSE Film Thickness Analyzer
J.A. Woollam M-44 Spectroscopic Ellipsometer
J.A. Woollam EC-270 Ellipsometer Controller
J.A. Woollam LPS-420 Xenon Light Source
Manual Loading of up to 300mm Wafers
Yaskawa ERCR-NS01-B004 Motion Controller

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Location: Plano, Texas, United States

Unit Price Unstated

Number of Units 1

Manufacturer Nanometrics

Model 8300XSE

Wafer Size Range
  Minimum 200 mm

  Maximum 300 mm

  Set Size 300 mm

Illumination Source Type Multi-wavelength Source

Multi-Layer Film Capacity YES

Micro Spot Optics YES

Scanning Stage YES

Wafer Mapping YES

Controller Type PC Controller Type

Condition Excellent

Power Requirements 115 V     15.0 A     50/60 Hz     1 Phase