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FULL DESCRIPTION of Item 152329

in Ellipsometers
Item ID: 152329

Offered1 Offered at Best Price


PLASMOS SD2000

Automatic Ellipsometer

Thin Film Thickness Measurement System

Location: Plano, TX, United States
Unit Price Unstated
Number of Units 1
Manufacturer Plasmos
Model SD2000
Wafer Size Range 
  Maximum 200 mm
Illumination Source Type HeNe Laser
Scanning Stage YES
Controller Type PC/VME
Software Revision Level 6.28F
External Cooling Air Cooled
Other Information 
  • 200mm Chuck
  • ELECTROPHYSICS AF-750 Microscope Autofocus System
  • LEITZ Objective Plan 10X/.2
  • TELI CCD Camera Model CS8310B
  • 2ea PMS Ports, 1ea PPZ2 Port, 1ea PTV Port
  • CPU: VERO EMV-PCIP21 8S
Year of Manufacture 1994
Power Requirements 230 V     50/60 Hz