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FULL DESCRIPTION of Item 172746

in Ellipsometers
Item ID: 172746

Offered1 Offered at Best Price


Plasmos SD-2004 Multi-Wavelength Ellipsometer

Plasmos SD-2004 Multi-Wavelength Ellipsometer

Location: Plano, TX, United States
Unit Price Unstated
Number of Units 1
Manufacturer Plasmos
Model SD 2004
Wafer Size Range 
  Minimum 100 mm
  Maximum 200 mm
Illumination Source Type Multi-wavelength Source
Multi-Layer Film Capacity YES
Micro Spot Optics YES
Scanning Stage YES
Wafer Mapping YES
Controller Type PC/VME
Condition Very Good