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FULL DESCRIPTION of Item 254099

in Other Metrology Equipment
Item ID: 254099

Offered 1 Offered at Best Price


KLA Altair 8920i AOI Tool

KLA Altair 8920i AOI Tool

  • For 200mm & 300mm Patterned & Unpatterned Wafers
  • Brightfield/Darkfield Optics
  • 2X, 3.5X, 5X & 10X Objectives
  • 35X Review Capability
  • 0.4 um Max DF Sensitivity
  • Die to Die Detection Algorithm
  • Focus Tracking
  • RBB Defect Classification
  • 18 WPH Throughput
 KLA Altair 8920i AOI Tool
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Location: Austin, Texas, United States
Unit Price Unstated
Number of Units 1
Manufacturer KLA
Model Altair 8920i
Description AOI Tool
CE Marked YES