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Wafer Inspection

Surface Inspection

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FULL DESCRIPTION of Item 262225

in Unpatterned Wafer Inspection

Item ID: 262225

1 Offered at Best Price

Takano WM-7S Unpatterned Wafer Surface Inspection Tool

Takano WM-7S Unpatterned Wafer Surface Inspection Tool
405 nm Laser Source
Particle Detection Down to 79 nm
Configured for 200mm Wafers
Manufactured in 2023
Unused Since Installation/Qualification

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Location: Tokyo, Tokyo, Japan

Unit Price Unstated

Number of Units 1

Manufacturer Takano

Model WM-7S

Description Unpatterned Wafer Surface Inspection Tool

Cassette to Cassette YES

Year of Manufacture 2023