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in Critical Dimension Scanning Electron Microscopes
Item ID: 77955

Offered 1 Offered at Best Price

Jeol JWS-7505ZH

Critical Dimension Scanning Electron Microscope
Jeol JWS-7505ZH
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Location: Plano, TX, United States
Unit Price Unstated
Number of Units 1
Manufacturer JEOL
Model JWS-7505ZH
Wafer Size Range 
  Minimum 100 mm
  Maximum 200 mm
Resolution 80.00 Å
Cassette to Cassette YES
Other Information 
  • Operation Console WS-7505BU
  • Automatic Handling of 100mm - 200mm Wafers
  • 8nm (0.008 micron) Maximum Resolution (at 1kV Accelerating Voltage)
  • TFE Emmitter Electron Optics
  • 100X - 200,000X Magnification
  • 0.5kV - 6kV Accelerating Voltage
  • 200mm (dia.) Specimen Stage
  • 200mm X & Y Movement
  • -15º - 60º Tilt Range
  • 360º Endless Rotation
  • 30 mm/sec X & Y Maximum Speed
  • Optical Wafer Pre-Alignment
  • Power Supply WSZ-7505BUZH
CE Marked YES
Year of Manufacture 1997