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Metrology Equipment


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List all 58 product types under Metrology EquipmentList all 58 product types under Metrology Equipment


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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes
Make Model
  $  
110263
ADE  

ADE  

Episcan 1000 

List all items of this typeFT-IR Spectrometers

in Spectrometers

ADE Episcan 1000:
Epi Metrology Spectrometer

Film Thickness Measurement & Mapping Tool
1   F*
159266
Bausch & Lomb  

Bausch & Lomb  

SZ4 

List all items of this typeStereo Microscopes

in Optical Microscopes

Bausch & Lomb Stereo Zoom 4:
StereoZoom 4 Microscope with Boom Stand
1   F*
161016
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 4 

List all items of this typeStereo Microscopes

in Optical Microscopes

Bausch & Lomb StereoZoom 4:
Microscope on Small Base
1  
161018
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 6 Plus 

List all items of this typeStereo Microscopes

in Optical Microscopes

Bausch & Lomb StereoZoom 6 Plus:
Microscope Head
1   F*
159267
Bausch & Lomb  

Bausch & Lomb  

SZ 6-ST 

List all items of this typeStereo Microscopes

in Optical Microscopes

Bausch & Lomb StereoZoom 6-ST:
StereoZoom Microscope with Boom Stand
1  
157435
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 7 

List all items of this typeStereo Microscopes

in Optical Microscopes

BAUSCH & LOMB StereoZoom 7:
Microscope & Boom Stand
1   F*
186721
Bio-Rad  

Bio-Rad  

QS-408M 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

Bio-Rad:
QS-408 FT-IR Spectrometer
2  
186722
Bio-Rad  

Bio-Rad  

QS-300 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

Bio-Rad:
Bio-Rad QS-300 FT-IR Spectrometer
1  
186723
Bio-Rad  

Bio-Rad  

QS-312 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

Bio-Rad:
Bio-Rad QS-312 FT-IR Spectrometer
1  
121504
Bio-Rad  

Bio-Rad  

Q5 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

Biorad Q5:
Overlay Registration Tool
2  
31390
Bio-Rad  

Bio-Rad  

Q5 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

BioRad Q5:
Overlay Registration Tool - Has Been Upgraded to a Q6

CD Measurement, Single and Two-Axis Overlay Registration
1   F*
54652
Bio-Rad  

Bio-Rad  

Q7/Q8 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

BioRad Q7/Q8 Overlay Metrology Tool:
Overlay Metrology Tool for up to 200mm Wafers
1   F*
159250
Biorad  

Biorad  

QS-1200 

List all items of this typeFT-IR Spectrometers

in Spectrometers

Biorad QS-1200:
FT-IR Spectrometer
1  
130059
Bio-Rad  

Bio-Rad  

QS-300 

List all items of this typeFT-IR Spectrometers

in Spectrometers

Biorad QS-300 Spectrometer:
FT-IR Spectrometer
1   F*
74140
Bio-Rad  

Bio-Rad  

QS-408M 

List all items of this typeFT-IR Spectrometers

in Spectrometers

BioRad QS-408M:
Manual FT-IR (Fourier Transform Infrared Spectrophotometer) for Epi Measurement - 200mm Wafers
1   F*
144802
CR Technology  

CR Technology  

UF160/0 

List all items of this typeXray Fluorescence Spectrometers

in Spectrometers

CR Technology XRay System UF160/0:
XRAY Wafer Analyzer
1  
194899
DELTRONIC  

DELTRONIC  

DH14-RR 

List all items of this typeMeasuring Microscopes

in Optical Microscopes

Deltronic DH14-RR Profile Projector :
Deltronic DH14-RR Profile Projector 
  • 20X Objective Lens
1  
159268
Diagnostic Instrumts  

Diagnostic Instrumts  

 

List all items of this typeStereo Microscopes

in Optical Microscopes

Diagnostic Instruments:
Microscope Boom Stand
2  
49926
GCA/Tropel  

GCA/Tropel  

9000 

List all items of this typeUnpatterned Wafer Inspection

in Surface Inspection

GCA/TROPEL 9000:
Surface Flatness Analyzer
1  
35762
Hitachi  

Hitachi  

S-7000 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

Hitachi S-7000:
CD SEM Measurement Tool
1   F*
104306
KLA-Tencor  

KLA-Tencor  

AlphaStep 300 

List all items of this typeProfilometers

in Film Thickness Testers

KLA-Tencor AlphaStep 300 Profilometer:
Profilometer
1  
170602
Materials Dev Corp  

Materials Dev Corp  

986G 

List all items of this typeCV Plotters

in Metrology Equipment

MDC 986G Autoloading CV Plotter:
MDC 986G Autoloading CV Plotter
  • 200mm Nickel Plated Hot Chuck
  • MDC Quiet Chuck 490 Controller
  • Mini -Environment with HEPA Filtration
  • Genmark 3 Axis Robot with Controller
  • Genmark Wafer Pre-Aligner
  • Agilent 4284A Precision LCR Meter
  • Keithley 236 Source Measure Unit
  • MDC Multiplexer
  • System Control PC with Windows 2000 OS
    • 3.5" FDD, CD-ROM Drive
    • Keyboard with Trackball & Flat Screen Display
  • 3ea Signatone 725 Micropositioners
  • Cohu Color CCD Camera 
  • Sony Color Monitor
1  
4903
Materials Dev Corp  

Materials Dev Corp  

CSM 

List all items of this typeCV Plotters

in Metrology Equipment

MDC CSM:
Automatic CV Plotter
1  
3456
Materials Dev Corp  

Materials Dev Corp  

CSM/16 

List all items of this typeCV Plotters

in Metrology Equipment

MDC CSM/16:
Automatic CV Plotter with RM-1600 Computer
1  
151228
Materials Dev Corp  

Materials Dev Corp  

CSM/16 

List all items of this typeCV Plotters

in Metrology Equipment

MDC CSM/16 CV Plotter:
CV Plotter with DuoChuck
1  
159451
Nicolet  

Nicolet  

Magna-IR 550 

List all items of this typeFT-IR Spectrometers

in Spectrometers

NICOLET Magna-IR 550:
FT-IR Spectrometer
1   F*
179537
Nikon  

Nikon  

Optiphot 150 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

Nikon Optiphot 150 Wafer Inspection Microscope:
Nikon Optiphot 150 Wafer Inspection Microscope 
1  
155646
Nikon  

Nikon  

Optiphot 200 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

Nikon Optiphot 200:

NIKON Optiphot 200 Wafer Inspection Stand, Including

  • Focus Mechanism
  • Interference Contrast Polarizer/Analyzer
1  
120404
Nikon  

Nikon  

Optiphot 88 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

Nikon Optiphot 88:

NIKON Optiphot-88 Wafer Inspection Microscope  

  • 5 Position Turret with Motorized Rotation
  • BDPlan 5X, 10X, 20X, 40X & 100X Bright/Darkfield Objective Lenses
  • Trinocular Viewing Head with 10X Widefield Eyepieces
  • C-Mount with Television Lens Included
  • Vertical Illuminator with 12V/50W Halogen Lamp Housing
  • Brightfield & Darkfield Channels
  • Dual Iris Apertures

Specimen Stage with 200mm X 200mm XY Travel

1  
86230
Nikon  

Nikon  

Optistation 3 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

Nikon Optistation 3:
Automatic Wafer Inspection Station
1  
131378
Nikon  

Nikon  

Optistation 3 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

Nikon Optistation 3:
Wafer Inspection Tool for 6" Wafers
1  
124185
Nikon  

Nikon  

Optistation 3 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

Nikon Optistation 3:
Wafer Inspection Tool for 6" Wafers
1  
87091
Nikon  

Nikon  

Optistation 3A 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

Nikon Optistation 3A:
Automatic Wafer Inspection Station
1  
135595
Nikon  

Nikon  

V-12 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

Nikon V-12 Profile Projector:
Profile Projector

Optical Comparator
1  
61043
Nikon  

Nikon  

Optiphot 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

Nikon/Semprex Measuring Microscope:

 NIKON/SEMPREX Wafer Measuring Microscope

  • 4 Position Turret
  • NIKON MPlan 2.5X, BDPlan 10X, 20X & 40X Objective Lenses
  • NIKON Binocular Viewing Head with 10X Widefield Eyepieces
  • NIKON Vertical Illuminator with 12V/50W Halogen Lamp Housing
    • Brightfield & Darkfield Channels
    • Dual Iris Apertures
  • NIKON Model UN Illumination Transformer
  • SEMPREX Microscope Stand
    • Specimen Stage 6” X 6.75”
      • 2ea Mitutoyo 164-136 Digital Micrometers for XY Measurement
      • 0-2” in X Axis & 0-1.5” in Y Axis; Resolution to 0.0001”
      • Mitutoyo 534-223-1 Digital Micrometer for Height Measurement
      • 0-1” in Z Axis; Resolution to 0.0001”
1   F*
160214
Olympus  

Olympus  

BH-BHM 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

Olympus BH-BHM Microscope:
Wafer Inspection Microscope
1   F*
120405
Olympus  

Olympus  

SZ3060 

List all items of this typeStereo Microscopes

in Optical Microscopes

Olympus SZ3060:
StereoZoom Microscope
1   F*
120406
Olympus  

Olympus  

SZ3060 

List all items of this typeStereo Microscopes

in Optical Microscopes

Olympus SZ3060:
StereoZoom Microscope
1   F*
172746
Plasmos  

Plasmos  

SD 2004 

List all items of this typeEllipsometers

in Film Thickness Testers

Plasmos SD-2004 Multi-Wavelength Ellipsometer:
Plasmos SD-2004 Multi-Wavelength Ellipsometer
1  
179535
Plasmos  

Plasmos  

SD2000 

List all items of this typeEllipsometers

in Film Thickness Testers

1  
122734
Rigaku  

Rigaku  

3630 

List all items of this typeXray Fluorescence Spectrometers

in Spectrometers

Rigaku 3630:
Xray Fluorescence Spectrometer
1  
172365
Rigaku  

Rigaku  

3640 

List all items of this typeXray Fluorescence Spectrometers

in Spectrometers

Rigaku 3640 Xray Fluorescence Spectrometer:
Rigaku 3640 Xray Fluorescence Spectrometer
1   F*
50006
Sagax  

Sagax  

Isoscope 125 

List all items of this typeEllipsometers

in Film Thickness Testers

Sagax Isoscope 125:
Ellipsometer
1  
54633
SDI Diagnostics Inc  

SDI Diagnostics Inc  

FAaST 300 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

SDI FAaST 300:
Wafer Characterization Tool for up to 300mm Wafers
1  
54632
SDI Diagnostics Inc  

SDI Diagnostics Inc  

FAaST 330 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

SDI FAaST 330:
Wafer Characterization Tool
1  
179531
Solid State Measrmnt  

Solid State Measrmnt  

470i 

List all items of this typeCV Plotters

in Metrology Equipment

1  
50017
KLA-Tencor  

KLA-Tencor  

Surfscan 4500 

List all items of this typeUnpatterned Wafer Inspection

in Surface Inspection

Tencor Surfscan 4500:

Wafer Surface Analysis 

1  
23995
Vision Engineering  

Vision Engineering  

Dynascope 

List all items of this typeMicroscopes - Other

in Optical Microscopes

Vision Engineering - Dynascope:
Projection Microscope
1  


*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
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   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.