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Metrology Equipment


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Group Offers into sub-categories under Metrology EquipmentGroup Offers into sub-categories under Metrology Equipment

List all 58 product types under Metrology EquipmentList all 58 product types under Metrology Equipment


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 Offered (box) or Wanted (coins)  Item ID  Short Description Product Type / Details # Price Notes
Make Model
  $  
110263

ADE  

Episcan 1000 

List all items of this typeFT-IR Spectrometers

in Spectrometers

1   F*
ADE Episcan 1000
Epi Metrology Spectrometer

Film Thickness Measurement & Mapping Tool
159266

Bausch & Lomb  

SZ4 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   F*
Bausch & Lomb Stereo Zoom 4
StereoZoom 4 Microscope with Boom Stand
161016

Bausch & Lomb  

StereoZoom 4 

List all items of this typeStereo Microscopes

in Optical Microscopes

1  
Bausch & Lomb StereoZoom 4
Microscope on Small Base
161018

Bausch & Lomb  

StereoZoom 6 Plus 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   F*
Bausch & Lomb StereoZoom 6 Plus
Microscope Head
159267

Bausch & Lomb  

SZ 6-ST 

List all items of this typeStereo Microscopes

in Optical Microscopes

1  
Bausch & Lomb StereoZoom 6-ST
StereoZoom Microscope with Boom Stand
157435

Bausch & Lomb  

StereoZoom 7 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   F*
BAUSCH & LOMB StereoZoom 7
Microscope & Boom Stand
186721

Bio-Rad  

QS-408M 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

2  
Bio-Rad
QS-408 FT-IR Spectrometer
186722

Bio-Rad  

QS-300 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

1  
Bio-Rad
Bio-Rad QS-300 FT-IR Spectrometer
186723

Bio-Rad  

QS-312 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

1  
Bio-Rad
Bio-Rad QS-312 FT-IR Spectrometer
121504

Bio-Rad  

Q5 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

2  
Biorad Q5
Overlay Registration Tool
31390

Bio-Rad  

Q5 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

1  
BioRad Q5
Overlay Registration Tool - Has Been Upgraded to a Q6

CD Measurement, Single and Two-Axis Overlay Registration
121505

Bio-Rad  

Q7 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

3  
Biorad Q7
Overlay Registration Tool
54651

Bio-Rad  

Q7/Q8 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

1  
BioRad Q7/Q8 Overlay Metrology Tool
Overlay Metrology Tool for up to 200mm Wafers
54652

Bio-Rad  

Q7/Q8 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

1   F*
BioRad Q7/Q8 Overlay Metrology Tool
Overlay Metrology Tool for up to 200mm Wafers
122412

Bio-Rad  

Q8 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

1  
Biorad Q8
Overlay Registration
159250

Biorad  

QS-1200 

List all items of this typeFT-IR Spectrometers

in Spectrometers

1  
Biorad QS-1200
FT-IR Spectrometer
130059

Bio-Rad  

QS-300 

List all items of this typeFT-IR Spectrometers

in Spectrometers

1   F*
Biorad QS-300 Spectrometer
FT-IR Spectrometer
74140

Bio-Rad  

QS-408M 

List all items of this typeFT-IR Spectrometers

in Spectrometers

1   F*
BioRad QS-408M
Manual FT-IR (Fourier Transform Infrared Spectrophotometer) for Epi Measurement - 200mm Wafers
144802

CR Technology  

UF160/0 

List all items of this typeXray Fluorescence Spectrometers

in Spectrometers

1  
CR Technology XRay System UF160/0
XRAY Wafer Analyzer
159268

Diagnostic Instrumts  

 

List all items of this typeStereo Microscopes

in Optical Microscopes

2  
Diagnostic Instruments
Microscope Boom Stand
49926

GCA/Tropel  

9000 

List all items of this typeUnpatterned Wafer Inspection

in Surface Inspection

1  
GCA/TROPEL 9000
Surface Flatness Analyzer
35762

Hitachi  

S-7000 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

1   F*
Hitachi S-7000
CD SEM Measurement Tool
54074

Irvine Optical  

UltraSpec III 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

1  
Irvine Optical UltraSpec III
Wafer Inspection Station
136281

Irvine Optical Co.  

UltraSpec III 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

1  
Irvine Optical UltraSpec III Wafer Inspection Station
Irvine Optical UltraSpec III Wafer Inspection Station
131723

Irvine Optical Co.  

Ultrastation 3 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

1  
IRVINE OPTICAL Ultrastation 3
Macro Inspection Tool
184441

Irvine Optical Co.  

Ultrastation 3.E 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

1  
Irvine Optical Ultrastation 3.E Automatic Wafer Inspection Microscope
Irvine Optical Ultrastation 3.E Automatic Wafer Inspection Microscope
  • Automatic Wafer Loading for up to 200mm Wafers
  • LED Display and Extended Control Keyboard
  • Nikon CF Plan Optics; 5X, 10X, 20X, 50X & 150X B/Dfield Objectives
  • Differential Interference Contrast 
  • Ergonomic Trinocular Head with CFWN 10X/20 Eyepieces
  • Motic Moticam 1000 USB Camera
  • Nikon LHS-H100P-1 Lamphouse
  • 12V 100W Halogen Lamp
184442

Irvine Optical Co.  

Ultrastation 3.E 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

1  
Irvine Optical Ultrastation 3.E Automatic Wafer Inspection Microscope
Irvine Optical Ultrastation 3.E Automatic Wafer Inspection Microscope
  • Automatic Wafer Loading for up to 200mm Wafers
  • LED Display and Standard Control Keyboard
  • Motorized Turret with Nikon BD Plan Optics
    • 5X, 10X, 40X & 100X B/Dfield Objectives
  • Ergonomic Trinocular Head with UW 10X/25 Eyepieces
  • Nikon Lamphouse with 12V 100W Halogen Lamp
77955

JEOL  

JWS-7505ZH 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

1   F*
Jeol JWS-7505ZH
Critical Dimension Scanning Electron Microscope
101271

KLA-Tencor  

AIT 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

1  
KLA-Tencor AIT
Patterned Wafer Defect Inspection Tool with Auto Focus
104306

KLA-Tencor  

AlphaStep 300 

List all items of this typeProfilometers

in Film Thickness Testers

1  
KLA-Tencor AlphaStep 300 Profilometer
Profilometer
77963

KLA-Tencor  

FT-750 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

1  
KLA-Tencor FT-750
Film Thickness Mapping Tool
129848

KLA-Tencor  

M-Gage 

List all items of this typeNon-Contact Resistivity Testers

in Resistivity Testers

1   F*
KLA-Tencor M-Gage
Non-Contact Wafer Monitor for Sheet Resistance

Model 50-00070
99977

Leica  

INS 2000 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

1  
LEICA INS 2000
Wafer Handling System for a Leica INS 2000 Defect Review System - No Microscope Included
170602

Materials Dev Corp  

986G 

List all items of this typeCV Plotters

in Metrology Equipment

1  
MDC 986G Autoloading CV Plotter
MDC 986G Autoloading CV Plotter
  • 200mm Nickel Plated Hot Chuck
  • MDC Quiet Chuck 490 Controller
  • Mini -Environment with HEPA Filtration
  • Genmark 3 Axis Robot with Controller
  • Genmark Wafer Pre-Aligner
  • Agilent 4284A Precision LCR Meter
  • Keithley 236 Source Measure Unit
  • MDC Multiplexer
  • System Control PC with Windows 2000 OS
    • 3.5" FDD, CD-ROM Drive
    • Keyboard with Trackball & Flat Screen Display
  • 3ea Signatone 725 Micropositioners
  • Cohu Color CCD Camera 
  • Sony Color Monitor
4903

Materials Dev Corp  

CSM 

List all items of this typeCV Plotters

in Metrology Equipment

1  
MDC CSM
Automatic CV Plotter
3456

Materials Dev Corp  

CSM/16 

List all items of this typeCV Plotters

in Metrology Equipment

1  
MDC CSM/16
Automatic CV Plotter with RM-1600 Computer
151228

Materials Dev Corp  

CSM/16 

List all items of this typeCV Plotters

in Metrology Equipment

1  
MDC CSM/16 CV Plotter
CV Plotter with DuoChuck
5074

Nanometrics  

CD-50 

List all items of this typeOptical CD Measurement

in Critical Dimension Measurement Equipment

1  
Nanometrics Nanoline CD-50
Critical Dimension Measurement Tool for up to 6" Wafers
49938

Nanometrics  

CD-50 

List all items of this typeOptical CD Measurement

in Critical Dimension Measurement Equipment

1   F*
Nanometrics Nanoline CD-50
CD Measurement System
10354

Nanometrics  

NanoSpec AFT 

List all items of this typeMicrospectrophotometers

in Spectrophotometers

1  
Nanometrics NanoSpec AFT
Film Thickness Measurement System (Parts Tool Only)

PARTS TOOL ONLY
61872

Nanometrics  

NanoSpec 181 

List all items of this typeMicrospectrophotometers

in Spectrophotometers

1   F*
Nanometrics NanoSpec AFT #010-0181
Film Thickness Analyzers
116240

Nanometrics  

NanoSpec AFT 2100 

List all items of this typeMicrospectrophotometers

in Spectrophotometers

1   F*
Nanometrics NanoSpec AFT 2100
Automatic Film Thickness System
116241

Nanometrics  

NanoSpec AFT 212 

List all items of this typeMicrospectrophotometers

in Spectrophotometers

1   F*
Nanometrics NanoSpec AFT 212
Automatic Film Thickness System
159451

Nicolet  

Magna-IR 550 

List all items of this typeFT-IR Spectrometers

in Spectrometers

1   F*
NICOLET Magna-IR 550
FT-IR Spectrometer
34150

Nikon  

Metaphot 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   F*
120404

Nikon  

Optiphot 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1  
Nikon Optiphot
Wafer Inspection Microscope
179537

Nikon  

Optiphot 150 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1  
Nikon Optiphot 150 Wafer Inspection Microscope
Nikon Optiphot 150 Wafer Inspection Microscope 
155646

Nikon  

Optiphot 200 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1  
Nikon Optiphot 200
Wafer Inspection Microscope
(PARTS TOOL ONLY)
24285

Nikon  

Optiphot 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   F*
Nikon Optiphot Metallurgical Microscope
Upright Microscope with 3D Vision - Edge Model H160 Real-Time 3D Microscope Including Dual 35mm Cameras
61043

Nikon  

Optiphot 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   F*
Nikon Optiphot Microscope
Microscope
61515

Nikon  

Optistation 2A 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

1  
NIKON Optistation 2A
Automatic Wafer Inspection System w/Auto Focus

PARTS TOOLS ONLY
86230

Nikon  

Optistation 3 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

1  
Nikon Optistation 3
Automatic Wafer Inspection Station
124185

Nikon  

Optistation 3 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

1  
Nikon Optistation 3
Wafer Inspection Tool for 6" Wafers
131378

Nikon  

Optistation 3 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

1  
Nikon Optistation 3
Wafer Inspection Tool for 6" Wafers
87091

Nikon  

Optistation 3A 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

1  
Nikon Optistation 3A
Automatic Wafer Inspection Station
135595

Nikon  

V-12 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

1  
Nikon V-12 Profile Projector
Profile Projector

Optical Comparator
77956

Olympus  

AL100-B8 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

1   F*
Olympus AL100-B8
Programmable Wafer Loader for up to 200mm Wafers
160214

Olympus  

BH-BHM 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   F*
Olympus BH-BHM Microscope
Wafer Inspection Microscope
120405

Olympus  

SZ3060 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   F*
Olympus SZ3060
StereoZoom Microscope
120406

Olympus  

SZ3060 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   F*
Olympus SZ3060
StereoZoom Microscope
77964

Philips  

SPW-2800 

List all items of this typeXray Fluorescence Spectrometers

in Spectrometers

1   F*
Philips SPW-2800
Xray Wafer Analyzer

High-Precision Wafer Analyzer
172746

Plasmos  

SD 2004 

List all items of this typeEllipsometers

in Film Thickness Testers

1  
Plasmos SD-2004 Multi-Wavelength Ellipsometer
Plasmos SD-2004 Multi-Wavelength Ellipsometer
152329

Plasmos  

SD2000 

List all items of this typeEllipsometers

in Film Thickness Testers

1  
PLASMOS SD2000
Automatic Ellipsometer

Thin Film Thickness Measurement System
179535

Plasmos  

SD2000 

List all items of this typeEllipsometers

in Film Thickness Testers

1  
179536

Plasmos  

SD4000 

List all items of this typeEllipsometers

in Film Thickness Testers

1  
122734

Rigaku  

3630 

List all items of this typeXray Fluorescence Spectrometers

in Spectrometers

1  
Rigaku 3630
Xray Fluorescence Spectrometer
172365

Rigaku  

3640 

List all items of this typeXray Fluorescence Spectrometers

in Spectrometers

1   F*
Rigaku 3640 Xray Fluorescence Spectrometer
Rigaku 3640 Xray Fluorescence Spectrometer
54993

Rigaku  

3700H 

List all items of this typeXray Fluorescence Spectrometers

in Spectrometers

1  
Rigaku 3700H
TXRF Wafer Analyzer
50006

Sagax  

Isoscope 125 

List all items of this typeEllipsometers

in Film Thickness Testers

1  
Sagax Isoscope 125
Ellipsometer
186720

SDI Diagnostics Inc  

FAaST230 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

1  
SDi
SDi FAaST230 Wafer Characterization Tool
54633

SDI Diagnostics Inc  

FAaST 300 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

1  
SDI FAaST 300
Wafer Characterization Tool for up to 300mm Wafers
54632

SDI Diagnostics Inc  

FAaST 330 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

1  
SDI FAaST 330
Wafer Characterization Tool
100995

SDI Diagnostics Inc  

SPV 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

1  
SDI SPV Surface Profiler
Surface Profiler
179531

Solid State Measrmnt  

470i 

List all items of this typeCV Plotters

in Metrology Equipment

1  
85605

Nikon  

K2-IND/NIKON 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1  
TECHNICAL INSTRUMENT K2
K2-IND/NIKON Confocal Microscope
168828

Tencor  

P-20h 

List all items of this typeProfilometers

in Film Thickness Testers

1  
Tencor P-20h Long Scan Profiler
Tencor P-20h Long Scan Profiler
  • 3" - 200mm Wafers
  • MicroHead Stylus Module
  • Automatic Wafer Handling
    • Single Cassette Platform
    • Wafer Prealigner
  • Wafer Stress Option
50017

KLA-Tencor  

Surfscan 4000 

List all items of this typeUnpatterned Wafer Inspection

in Surface Inspection

1  
Tencor Surfscan 4000 - PARTS TOOL ONLY
Wafer Surface Analysis - Parts Tool Only
50026

Veeco  

Dektak I 

List all items of this typeProfilometers

in Film Thickness Testers

1  
Veeco Dektak I Profilometer
PARTS TOOL ONLY
23995

Vision Engineering  

Dynascope 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1  
Vision Engineering - Dynascope
Projection Microscope
35538

Wild  

M420 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   F*


*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.