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Critical Dimension Measurement Equipment


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List all 4 product types under Critical Dimension Measurement EquipmentList all 4 product types under Critical Dimension Measurement Equipment
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    •  
     Offered (box) or Wanted (coins)  Item ID  Short Description Product Type / Details # Price Notes
    Make Model
      $  
    31390

    Bio-Rad  

    Q5 

    List all items of this typeOverlay Registration

    in Critical Dimension Measurement Equipment

    		 1
    BioRad Q5
    Overlay Registration Tool - Has Been Upgraded to a Q6

    CD Measurement, Single and Two-Axis Overlay Registration
    121504

    Bio-Rad  

    Q5 

    List all items of this typeOverlay Registration

    in Critical Dimension Measurement Equipment

    		 2
    Biorad Q5
    Overlay Registration Tool
    121505

    Bio-Rad  

    Q7 

    List all items of this typeOverlay Registration

    in Critical Dimension Measurement Equipment

    		 3
    Biorad Q7
    Overlay Registration Tool
    54651

    Bio-Rad  

    Q7/Q8 

    List all items of this typeOverlay Registration

    in Critical Dimension Measurement Equipment

    		 1
    BioRad Q7/Q8 Overlay Metrology Tool
    Overlay Metrology Tool for up to 200mm Wafers
    54652

    Bio-Rad  

    Q7/Q8 

    List all items of this typeOverlay Registration

    in Critical Dimension Measurement Equipment

    		 1 F*
    BioRad Q7/Q8 Overlay Metrology Tool
    Overlay Metrology Tool for up to 200mm Wafers
    122412

    Bio-Rad  

    Q8 

    List all items of this typeOverlay Registration

    in Critical Dimension Measurement Equipment

    		 1
    Biorad Q8
    Overlay Registration
    35762

    Hitachi  

    S-7000 

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Critical Dimension Measurement Equipment

    		 1 F*
    Hitachi S-7000
    CD SEM Measurement Tool
    77955

    JEOL  

    JWS-7505ZH 

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Critical Dimension Measurement Equipment

    		 1 F*
    Jeol JWS-7505ZH
    Critical Dimension Scanning Electron Microscope
    49938

    Nanometrics  

    CD-50 

    List all items of this typeOptical CD Measurement

    in Critical Dimension Measurement Equipment

    		 1 F*
    Nanometrics Nanoline CD-50
    CD Measurement System
    5074

    Nanometrics  

    CD-50 

    List all items of this typeOptical CD Measurement

    in Critical Dimension Measurement Equipment

    		 1
    Nanometrics Nanoline CD-50
    Critical Dimension Measurement Tool for up to 6" Wafers


    *   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

    NOTE:
       photo available
       reference document attached
      F* if the item is specially featured
      N* if the item is newly added, and/or
      R* if the item's price is recently reduced.