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ALL CATEGORIES   Metrology Eq

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	View All Offers Under Critical Dimension Measurement Equipment » Switch Major Category		Click an item's ID# below for its full specifications , or: Group Offers into sub-categories under Critical Dimension Measurement Equipment List all 4 product types under Critical Dimension Measurement Equipment

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Item ID  Short Description Product Type / Details # Price Notes Make Model   $   31390 Bio-Rad   Q5  Overlay Registration in Critical Dimension Measurement Equipment 1   BioRad Q5 Overlay Registration Tool - Has Been Upgraded to a Q6 CD Measurement, Single and Two-Axis Overlay Registration 121504 Bio-Rad   Q5  Overlay Registration in Critical Dimension Measurement Equipment 2   Biorad Q5 Overlay Registration Tool 121505 Bio-Rad   Q7  Overlay Registration in Critical Dimension Measurement Equipment 3   Biorad Q7 Overlay Registration Tool 54651 Bio-Rad   Q7/Q8  Overlay Registration in Critical Dimension Measurement Equipment 1   BioRad Q7/Q8 Overlay Metrology Tool Overlay Metrology Tool for up to 200mm Wafers 54652 Bio-Rad   Q7/Q8  Overlay Registration in Critical Dimension Measurement Equipment 1   F* BioRad Q7/Q8 Overlay Metrology Tool Overlay Metrology Tool for up to 200mm Wafers 122412 Bio-Rad   Q8  Overlay Registration in Critical Dimension Measurement Equipment 1   Biorad Q8 Overlay Registration 35762 Hitachi   S-7000  Critical Dimension Scanning Electron Microscopes in Critical Dimension Measurement Equipment 1   F* Hitachi S-7000 CD SEM Measurement Tool 77955 JEOL   JWS-7505ZH  Critical Dimension Scanning Electron Microscopes in Critical Dimension Measurement Equipment 1   F* Jeol JWS-7505ZH Critical Dimension Scanning Electron Microscope

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
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   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.