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Critical Dimension Measurement Equipment


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     Offered (box) or Wanted (coins)  Item ID  Short Description Product Type / Details # Price Note
    Make Model
      $  
    Offer 31390

    Bio-Rad

    Q5

    List all items of this typeOverlay Registration

    in Critical Dimension Measurement Equipment

    		 1
      BioRad Q5 CD Measurement, Single and Two-Axis Overlay Registration
    Offer 121504

    Bio-Rad

    Q5

    List all items of this typeOverlay Registration

    in Critical Dimension Measurement Equipment

    		 2
      Biorad Q5 Overlay Registration Tool
    Offer 121505

    Bio-Rad

    Q7

    List all items of this typeOverlay Registration

    in Critical Dimension Measurement Equipment

    		 3
      Biorad Q7 Overlay Registration Tool
    Offer 54651

    Bio-Rad

    Q7/Q8

    List all items of this typeOverlay Registration

    in Critical Dimension Measurement Equipment

    		 1
      BioRad Q7/Q8 Overlay Metrology Tool Overlay Metrology Tool for up to 200mm Wafers
    Offer 54652

    Bio-Rad

    Q7/Q8

    List all items of this typeOverlay Registration

    in Critical Dimension Measurement Equipment

    		 1 F*
      BioRad Q7/Q8 Overlay Metrology Tool Overlay Metrology Tool for up to 200mm Wafers
    Offer 122412

    Bio-Rad

    Q8

    List all items of this typeOverlay Registration

    in Critical Dimension Measurement Equipment

    		 1
      Biorad Q8 Overlay Registration
    Offer 35762

    Hitachi

    S-7000

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Critical Dimension Measurement Equipment

    		 1
      Hitachi S-7000 CD SEM Measurement Tool
    Offer 77955

    JEOL

    JWS-7505ZH

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Critical Dimension Measurement Equipment

    		 1
      Jeol JWS-7505ZH Critical Dimension Scanning Electron Microscope
    Offer 99978

    KLA-Tencor

    5100

    List all items of this typeOverlay Registration

    in Critical Dimension Measurement Equipment

    		 1
      KLA-Tencor 5100 Overlay Metrology Tool for 200mm Wafers
    Offer 49938

    Nanometrics

    CD-50

    List all items of this typeOptical CD Measurement

    in Critical Dimension Measurement Equipment

    		 1
      Nanometrics Nanoline CD-50 CD Measurement System
    Offer 5074

    Nanometrics

    CD-50

    List all items of this typeOptical CD Measurement

    in Critical Dimension Measurement Equipment

    		 1
      Nanometrics Nanoline CD-50 Critical Dimension Measurement Tool for up to 6" Wafers


    *  Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer
    NOTE:
       when photo available
       when document attached
      F* if the item is specially featured
      N* if the item is newly added, and/or
      R* if the item's price is recently reduced.