| Item ID |
Short Description |
Product Type / Details |
#
|
Price |
Note |
| Make |
Model |
| |
|
$ |
|
 |
87283 |
Applied Materials |
0010-00510 |
in Environmental Test Chambers
|
1
|
|
|
  |
| |
AMAT 0010-00510 Mainframe Module-5000 Etch-USED |
 |
87279 |
Applied Materials |
0020-29344 |
in Environmental Test Chambers
|
1
|
|
|
  |
| |
AMAT 0020-29344 8" Vectra IMP Shield-NEW |
 |
87280 |
Applied Materials |
0020-36524 |
in Environmental Test Chambers
|
1
|
|
|
  |
| |
AMAT 0020-36524 Liner-Lid A-NEW |
 |
87299 |
Applied Materials |
0020-70272 |
in Environmental Test Chambers
|
1
|
|
|
  |
| |
AMAT 0020-70272 Blade Shaft Assy-Right-New |
 |
87270 |
Applied Materials |
0020-85086 |
in Environmental Test Chambers
|
1
|
|
|
F* |
| |
AMAT 0020-85086 Plenum Shield-NEW |
 |
87273 |
Applied Materials |
0020-85420 |
in Environmental Test Chambers
|
1
|
|
|
  |
| |
AMAT 0020-85420 Pre-Focus Aperature2-NEW |
 |
87274 |
Applied Materials |
0020-85421 |
in Environmental Test Chambers
|
1
|
|
|
  |
| |
AMAT 0020-85421 Pre-Focus Aperature1-NEW |
 |
87271 |
Applied Materials |
0020-86641 |
in Environmental Test Chambers
|
1
|
|
|
  |
| |
AMAT 0020-86641 Bracket Suppression Electrode-NEW |
 |
87277 |
Applied Materials |
0021-01317 |
in Environmental Test Chambers
|
1
|
|
|
  |
| |
AMAT 0021-01317 Outer Shield 1"-NEW |
 |
87288 |
Applied Materials |
0021-01317 |
in Environmental Test Chambers
|
1
|
|
|
  |
| |
AMAT 0021-01317 Outer Shield 1"-NEW |
 |
87278 |
Applied Materials |
0021-02983 |
in Environmental Test Chambers
|
3
|
|
|
  |
| |
AMAT 0021-02983 Inner Shield 2"-NEW |
 |
87259 |
Applied Materials |
0021-04265 |
in Environmental Test Chambers
|
17
|
|
|
  |
| |
AMAT 0021-04265 Clamp, Quartz Window, ATM Lamp |
 |
87260 |
Applied Materials |
0021-11929 |
in Environmental Test Chambers
|
1
|
|
|
  |
| |
AMAT 0021-11929 Chamber Housing |
 |
87257 |
Applied Materials |
0021-20148 REV PA |
in Environmental Test Chambers
|
3
|
|
|
 |
| |
AMAT 0021-20148 REV PA Shield, Lower High Contact |
 |
87289 |
Applied Materials |
0021-20718 |
in Environmental Test Chambers
|
1
|
|
|
 |
| |
AMAT 0021-20718 Lower Pedestal Cover- NEW |
 |
87383 |
Applied Materials |
0021-22123 |
in Environmental Test Chambers
|
2
|
|
|
 |
| |
AMAT 0021-22123 Blank-off, Backside Purge, TIN Adapt |
 |
87340 |
Applied Materials |
0021-35749 |
in Environmental Test Chambers
|
2
|
|
|
  |
| |
AMAT 0021-35749 Isolator Ring-NEW |
 |
87286 |
Applied Materials |
0021-35749 |
in Environmental Test Chambers
|
4
|
|
|
 |
| |
AMAT 0021-35749 Isolator Ring- NEW |
 |
87319 |
Applied Materials |
0021-35872 |
in Environmental Test Chambers
|
2
|
|
|
  |
| |
AMAT 0021-35872 Cover |
 |
87343 |
Applied Materials |
0021-35946 |
in Environmental Test Chambers
|
1
|
|
|
  |
| |
AMAT 0021-35946 Edge Ring -NEW |
 |
87338 |
Applied Materials |
0021-35958 |
in Environmental Test Chambers
|
1
|
|
|
  |
| |
AMAT 0021-35958 Aluminum Plate |
 |
87253 |
Applied Materials |
0040-20267 |
in Environmental Test Chambers
|
1
|
|
|
  |
| |
AMAT 0040-20267 Reflector |
 |
87337 |
Applied Materials |
0200-36105 |
in Environmental Test Chambers
|
1
|
|
|
  |
| |
AMAT 0200-36105 Insert-CHB (2" Ring) - UHV Cleaned |
 |
87336 |
Applied Materials |
0200-36609 |
in Environmental Test Chambers
|
1
|
|
|
  |
| |
AMAT 0200-36609 Isolator Lid-NEW |
 |
87399 |
Applied Materials |
0240-28005 |
in Environmental Test Chambers
|
1
|
|
|
  |
| |
AMAT 0240-28005 Turbo Cooling Chamber Kit-NEW |
 |
87407 |
Applied Materials |
0242-75857 |
in Environmental Test Chambers
|
1
|
|
|
  |
| |
AMAT 0242-75857 Kit-Chamber w/SST Flare Fittings |
 |
64765 |
Blue M |
WSP-109C-3 |
in Environmental Test Chambers
|
1
|
|
|
F* |
| |
Blue M WSP-109C-3 Temperature Cycling Chamber Temperature Cycling Chamber |
 |
49973 |
Phoenix 520-NMP |
in Environmental Test Chambers
|
1
|
|
|
  |
| |
Phoenix 520-NMP Electrode Stabilizing Oven - Type 700-BT |
 |
64864 |
Thermonics T-2400R Temp Forcing System |
in Environmental Test Chambers
|
1
|
|
|
  |
| |
Thermonics T-2400R Temp Forcing System Precision Temperature Forcing System (PTFS) are used for localized, hot and cold temperature testing of semiconductor, hybrid and other components or small assemblies. |