Item ID: 172746 1 Offered at Best Price Plasmos SD-2004 Multi-Wavelength Ellipsometer Plasmos SD-2004 Multi-Wavelength Ellipsometer Location: Plano, TX, United States Unit Price Unstated Number of Units 1 Manufacturer Plasmos Model SD 2004 Wafer Size Range Minimum 100 mm Maximum 200 mm Illumination Source Type Multi-wavelength Source Multi-Layer Film Capacity YES Micro Spot Optics YES Scanning Stage YES Wafer Mapping YES Controller Type PC/VME Condition Very Good Make OFFERSend QUESTIONS