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FULL DESCRIPTION of Item 248941

in Ellipsometers
Item ID: 248941

Offered 1 Offered at Best Price


Nanometrics 8300XSE Film Thickness Analyzer

Nanometrics 8300XSE Film Thickness Analyzer

  • J.A. Woollam M-44 Spectroscopic Ellipsometer
  • J.A. Woollam EC-270 Ellipsometer Controller
  • J.A. Woollam LPS-420 Xenon Light Source
  • Manual Loading of up to 300mm Wafers
  • Yaskawa ERCR-NS01-B004 Motion Controller
Nanometrics 8300XSE Film Thickness Analyzer
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Location: Plano, Texas, United States
Unit Price Unstated
Number of Units 1
Manufacturer Nanometrics
Model 8300XSE
Wafer Size Range 
  Minimum 200 mm
  Maximum 300 mm
  Set Size 300 mm
Illumination Source Type Multi-wavelength Source
Multi-Layer Film Capacity YES
Micro Spot Optics YES
Scanning Stage YES
Wafer Mapping YES
Controller Type PC Controller Type
Condition Excellent
Power Requirements 115 V     15.0 A     50/60 Hz     1¬†Phase