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Item ID  Photo Short Description Product Type / Details # Price Notes Make Model   $   110263 ADE   ADE   Episcan 1000  FT-IR Spectrometers in Spectrometers ADE Episcan 1000: ADE Episcan 1000 Film Thickness Measurement & Mapping Tool Measurement of Epi Films <25µ ON-LINE TECHNOLOGIES 2110 Spectrometer Head IRVINE OPTICAL Nanoloader II Dual Cassette Wafer Handler ADE ACS Controller Windows NT Operating System Price.............................................................................$75,000.00 As-Is Price....................................................................$40,000.00 1   F* 159266 Bausch & Lomb   Bausch & Lomb   SZ4  Stereo Microscopes in Optical Microscopes Bausch & Lomb Stereo Zoom 4: StereoZoom 4 Microscope with Boom Stand 1   F* 161016 Bausch & Lomb   Bausch & Lomb   StereoZoom 4  Stereo Microscopes in Optical Microscopes Bausch & Lomb StereoZoom 4: Microscope on Small Base 1   161018 Bausch & Lomb   Bausch & Lomb   StereoZoom 6 Plus  Stereo Microscopes in Optical Microscopes Bausch & Lomb StereoZoom 6 Plus: Microscope Head 1   F* 159267 Bausch & Lomb   Bausch & Lomb   SZ 6-ST  Stereo Microscopes in Optical Microscopes Bausch & Lomb StereoZoom 6-ST: StereoZoom Microscope with Boom Stand 1   157435 Bausch & Lomb   Bausch & Lomb   StereoZoom 7  Stereo Microscopes in Optical Microscopes BAUSCH & LOMB StereoZoom 7: Microscope & Boom Stand 1   F* 231442 Bio-Rad Q7 Overlay Metrology Tool  Bio-Rad Q7 Overlay Metrology Tool  Metrology Equipment - Other in Metrology Equipment Bio-Rad Q7 Overlay Metrology Tool: Bio-Rad Q7 Overlay Metrology Tool 1   219230 Bio-Rad   Bio-Rad   Q8  Metrology Equipment - Other in Metrology Equipment Bio-Rad Q8 Overlay Metrology Tool: Bio-Rad Q8 Overlay Metrology Tool 1   225795 Bio-Rad   Bio-Rad   QS-1200  FT-IR Spectrometers in Spectrometers Bio-Rad QS-1200 FT-IR Spectrometer: BIORAD QS-1200 Automated FT-IR Spectrometer Non-Destructive Measurement of Epitaxial Silicon Films PIKE TECHNOLOGIES MAP300 Automatic Scanning Stage Manual Loading for up to 300mm Wafers 320 Test Points, 5mm Minimum Edge Exclusion & 3D Wafer Mapping FTS-175 Optical Bench Dynamically Tuned Beam Splitter NKBr Beam Splitter Dual Frequency IR Source Upgraded HeNe Laser System Control PC with Windows XP, 320G HD & 1G RAM Win-IR Pro (Rev. 2.51) Application Software QS-500 Epi (Rev. 1.31) Application Software Microsoft Access Database Application System Software, Applications Software & Site Preparation Manuals Included Refurbished & Fully Functional 1 110,000.00 121504 Bio-Rad   Bio-Rad   Q5  Overlay Registration in Critical Dimension Measurement Equipment Biorad Q5: Overlay Registration Tool 2   31390 Bio-Rad   Bio-Rad   Q5  Overlay Registration in Critical Dimension Measurement Equipment BioRad Q5: Overlay Registration Tool - Has Been Upgraded to a Q6 CD Measurement, Single and Two-Axis Overlay Registration 1   F* 54652 Bio-Rad   Bio-Rad   Q7/Q8  Overlay Registration in Critical Dimension Measurement Equipment BioRad Q7/Q8 Overlay Metrology Tool: Overlay Metrology Tool for up to 200mm Wafers 1   F* 144802 CR Technology   CR Technology   UF160/0  Xray Fluorescence Spectrometers in Spectrometers CR Technology XRay System UF160/0: XRAY Wafer Analyzer 1   194899 DELTRONIC   DELTRONIC   DH14-RR  Measuring Microscopes in Optical Microscopes Deltronic DH14-RR Profile Projector : Deltronic DH14-RR Profile Projector  20X Objective Lens 1   159268 Diagnostic Instrumts   Diagnostic Instrumts     Stereo Microscopes in Optical Microscopes Diagnostic Instruments: Microscope Boom Stand 2   238938 Four Dimensions   Four Dimensions   CV92A  CV Plotters in Metrology Equipment Four Dimensions CV92A Semiautomatic CV Plotter: Four Dimensions CV92A Semiautomatic CV Plotter Mercury Probe System Control Computer Embedded Computer 1 50,000.00 248945 Frontier Semi   Frontier Semi   900TC-VAC   Stress Measurement Equipment in Metrology Equipment Frontier 900TC-VAC Wafer Stress Gauge: Frontier 900TC-VAC Wafer Stress Gauge 1   49926 GCA/Tropel   GCA/Tropel   9000  Unpatterned Wafer Inspection in Surface Inspection GCA/TROPEL 9000: Surface Flatness Analyzer 1   35762 Hitachi   Hitachi   S-7000  Critical Dimension Scanning Electron Microscopes in Critical Dimension Measurement Equipment Hitachi S-7000: CD SEM Measurement Tool 1   F* 249592 J. A. Woollam   J. A. Woollam   M-2000  Ellipsometers in Film Thickness Testers J.A. Woollam M-2000 Spectroscopic Ellipsometer: J.A. Woollam M-2000 Spectroscopic Ellipsometer 1   249729 J.A. Woollam VB-200 Spectroscopic Ellipsometer  J.A. Woollam VB-200 Spectroscopic Ellipsometer  Ellipsometers in Film Thickness Testers J.A. Woollam VB-200 Spectroscopic Ellipsometer: J.A. Woollam VB-200 Spectroscopic Ellipsometer 1   218321 KLA-Tencor   KLA-Tencor   AIT  Patterned Wafer Inspection in Surface Inspection KLA-Tencor AIT Patterned Wafer Inspection Tool: KLA-Tencor AIT Patterned Wafer Inspection Tool Call for Details 1   250811 KLA-Tencor   KLA-Tencor   Aleris 8350  Film Thickness Testers - Other in Film Thickness Testers 1   104306 KLA-Tencor   KLA-Tencor   AlphaStep 300  Profilometers in Film Thickness Testers KLA-Tencor AlphaStep 300 Profilometer: Profilometer 1   250820 KLA-Tencor   KLA-Tencor   Archer 10XT  Overlay Registration in Critical Dimension Measurement Equipment KLA-TENCOR Archer 10XT Overlay Metrology Tool: KLA-TENCOR Archer 10XT Overlay Metrology Tool 1   250821 KLA-Tencor   KLA-Tencor   Archer 200 AIM  Overlay Registration in Critical Dimension Measurement Equipment KLA-TENCOR Archer 200 AIM Overlay Metrology Tool: KLA-TENCOR Archer 200 AIM Overlay Metrology Tool 1   249589 KLA-Tencor   KLA-Tencor   ASET-F5x  Film Thickness Testers - Other in Film Thickness Testers KLA-Tencor ASET-F5x UV Film Thickness Monitor: KLA-Tencor ASET-F5x UV Film Thickness Monitor 1   247845 KLA-Tencor   KLA-Tencor   Auto RS-55tc  4 & 6 Point Probes in Resistivity Testers KLA-Tencor Auto RS-55tc Resistivity Test Tool: KLA-TENCOR Auto RS-55tc Resistivity Mapping System Accommodates all Wafer Sizes from 50mm – 200mm 5 Megaohm/sq Measurement Range Typical Measurement Time: 5 – 4.5 Seconds per Test Site <0.2% (1 sigma) Measurement Repeatability Thermal Chuck Temperature Measurement Accuracy: ±0.5ºC PC Based System Controller 25 MHz 486 Based MPU 44 MB Removable Hard Disk 110 MB Fixed Hard Disk Drive 5” Floppy Disk Drive X-Y Map: Up to 1200 Sites Programmable Probe Qualification: 20 sites 1 - 30 Programmable Routine Test Sites (ASTM Standard Tests Included) 1 80,000.00 252332 KLA Tencor   KLA Tencor   DSW16E  Metrology Equipment - Other in Metrology Equipment KLA-Tencor DSW16E 300mm Calibration Wafer: KLA-Tencor DSW16E 300mm Calibration Wafer Part Number 0210691-000 (Advanced Technology Development) For Use on e-Beam Patterned Wafer Defect Inspection Tools    1   N* 249590 KLA-Tencor   KLA-Tencor   Flexus 5400  Stress Measurement Equipment in Metrology Equipment KLA-Tencor Flexus 5400 Stress Measurement Tool: KLA-Tencor Flexus 5400 Stress Measurement Tool 1   250812 KLA-Tencor   KLA-Tencor   HRP-240  Film Thickness Testers - Other in Film Thickness Testers KLA-TENCOR HRP-240 High Resolution Profiler: KLA-TENCOR HRP-240 High Resolution Profiler 1   250818 KLA-Tencor   KLA-Tencor   Puma 9120  Unpatterned Wafer Inspection in Surface Inspection KLA-TENCOR Puma 9120 Darkfield Inspection Tool: KLA-TENCOR Puma 9120 Darkfield Inspection Tool 1   250819 KLA-Tencor   KLA-Tencor   Puma 9130  Unpatterned Wafer Inspection in Surface Inspection KLA-TENCOR Puma 9130 Darkfield Inspection Tool: KLA-TENCOR Puma 9130 Darkfield Inspection Tool Parts Tool Please Inquire 1   250822 KLA-Tencor   KLA-Tencor   SWE Kit  Ellipsometers in Film Thickness Testers KLA-TENCOR Spectra fx SWE Kit: KLA-TENCOR Spectra fx Single Wave Ellipsometer Kit 1   250814 KLA-Tencor   KLA-Tencor   Surfscan SP1  Unpatterned Wafer Inspection in Surface Inspection KLA-Tencor Surfscan SP1 Unpatterned Surface Defect Tool: KLA-Tencor Surfscan SP1 Unpatterned Wafer Surface Defect Tool Dual Port 300mm 1   250815 KLA-Tencor   KLA-Tencor   Surfscan SP1  Unpatterned Wafer Inspection in Surface Inspection KLA-TENCOR Surfscan SP1 Unpatterned Wafer Surface Defect Too: KLA-TENCOR Surfscan SP1 Unpatterned Wafer Surface Defect Tool Dual Port 200mm 1   250816 KLA-Tencor   KLA-Tencor   Surfscan SP3  Unpatterned Wafer Inspection in Surface Inspection KLA-TENCOR Surfscan SP3 Unpatterned Surface Defect Tool: KLA-TENCOR Surfscan SP3 Unpatterned Wafer Surface Defect Tool Dual Port 300mm 1   247843 KLA-Tencor   KLA-Tencor   UV-1050  Film Thickness Testers - Other in Film Thickness Testers KLA-Tencor UV-1050 Thin Film Measurement Tool: KLA-Tencor UV-1050 Thin Film Measurement Tool Cassette to Cassette Wafer Handling Wafer sizes: 100mm, 150mm & 200mm Broadband UV Optics Dual Beam Spectrophotometry Applications: Polysilicon, UV Reflectivity & Simultaneous Oxide and TiN Thickness for CMP System Control PC with Windows NT OS Summit Application Software GEM / SECS Communication System Installation at Destination Available 1 55,000.00 250823 KLA-Tencor   KLA-Tencor   Viper 2401  Metrology Equipment - Other in Metrology Equipment KLA-TENCOR Viper 2401 After Develop Inspection Tool: KLA-TENCOR Viper 2401 After Develop Inspection Tool 1   248941 Nanometrics   Nanometrics   8300XSE  Ellipsometers in Film Thickness Testers Nanometrics 8300XSE Film Thickness Analyzer: Nanometrics 8300XSE Film Thickness Analyzer J.A. Woollam M-44 Spectroscopic Ellipsometer J.A. Woollam EC-270 Ellipsometer Controller J.A. Woollam LPS-420 Xenon Light Source Manual Loading of up to 300mm Wafers Yaskawa ERCR-NS01-B004 Motion Controller 1   159451 Nicolet   Nicolet   Magna-IR 550  FT-IR Spectrometers in Spectrometers NICOLET Magna-IR 550: FT-IR Spectrometer 1   F* 249588 Nikon   Nikon   Labophot 2  Upright Microscopes in Optical Microscopes 1   251440 Nikon   Nikon   NWL-641  Parts and Accessories - Other in Parts and Accessories, Microscope Nikon NWL-641 Microscope Automatic Wafer Loader: Nikon NWL-641 Microscope Automatic Wafer Loaders, 2ea Available 2   N* 251439 Nikon   Nikon   NWL200T  Parts and Accessories - Other in Parts and Accessories, Microscope Nikon NWL200T Microscope Wafer Loader: Nikon NWL200T Microscope Automatic Wafer Loader 1   N* 155646 Nikon   Nikon   Optiphot 200  Wafer Inspection Microscopes in Optical Microscopes Nikon Optiphot 200: NIKON Optiphot 200 Wafer Inspection Stand, Including Focus Mechanism Interference Contrast Polarizer/Analyzer 1   120404 Nikon   Nikon   Optiphot 88  Wafer Inspection Microscopes in Optical Microscopes Nikon Optiphot 88: NIKON Optiphot-88 Wafer Inspection Microscope   5 Position Turret with Motorized Rotation BDPlan 5X, 10X, 20X, 40X & 100X Bright/Darkfield Objective Lenses Trinocular Viewing Head with 10X Widefield Eyepieces C-Mount with Television Lens Included Vertical Illuminator with 12V/50W Halogen Lamp Housing Brightfield & Darkfield Channels Dual Iris Apertures Specimen Stage with 200mm X 200mm XY Travel 1   212138 Nikon   Nikon   Optiphot-150S  Wafer Inspection Microscopes in Optical Microscopes Nikon Optiphot-150S Wafer Inspection Microscope: Nikon Optiphot-150S Wafer Inspection Microscope 5X 10X, 20X, 50X & 100X CF Plan Brightfield EPI Objective Lenses Ergo Trinocular Head with CFWN 10X/20 WF Eyepieces Color CMOS Microscope Camera Wafer Stage for Use with Nikon NWL Wafer Loader 12V/50W Lamphouse with Internal Illumination Transformer Nikon NWL-641M Wafer Loader & Wafer Transfer XYO Stage Macro Inspection Capability Also Available with Bright/Darkfield Objective Lenses  Also Available without NWL-641 Wafer Loader 1   179537 Nikon   Nikon   Optiphot-150S  Wafer Inspection Microscopes in Optical Microscopes Nikon Optiphot-150S Wafer Inspection Microscope: Nikon Optiphot-150S Wafer Inspection Microscope 2.5X, 5X, 10X, 20X & 50X CF Plan Bright/Darkfield Objective Lenses Binocular Head with CFWN 10X/20 WF Eyepieces Wafer Stage for Use with Nikon NWL-641 Wafer Loader 12V/50W Lamphouse with Internal Illumination Transformer Nikon NWL-641M Wafer Loader & Wafer Transfer XYO Stage Macro Inspection Capability Also Available with Bright/Darkfield Objective Lenses  Also Available with Ergo Trinocular Head and Color Camera Also Available without NWL-641 Wafer Loader 1   124185 Nikon   Nikon   Optistation 3  Automatic Wafer Inspection Tools in Microscope Inspection Tools Nikon Optistation 3: Wafer Inspection Tool for 6" Wafers 1   131378 Nikon   Nikon   Optistation 3  Automatic Wafer Inspection Tools in Microscope Inspection Tools Nikon Optistation 3: Wafer Inspection Tool for 6" Wafers 1   86230 Nikon   Nikon   Optistation 3  Automatic Wafer Inspection Tools in Microscope Inspection Tools Nikon Optistation 3: Automatic Wafer Inspection Station 1   87091 Nikon   Nikon   Optistation 3A  Automatic Wafer Inspection Tools in Microscope Inspection Tools Nikon Optistation 3A: Automatic Wafer Inspection Station 1   245327 Nikon   Nikon   Ti2-E  Inverted Microscopes in Optical Microscopes Nikon Ti2-E Inverted Microscope: Nikon Ti2-E Inverted MicroscopeTi2-E Binocular Viewing Head with 2ea CFI 10X Eyepieces Nikon Ti2-N-ND-E Motorized DIC Sextuple Nosepiece, Including: Nikon Plan Fluor 10X Objective lens Nikon S Plan Fluor 40X ELWD Objective lens Nikon Plan APO 100X Objective lens Nikon Ti2-F-FLT-E Motorized Epi-Fluorescence Filter Cube Turret Nikon Ti2-LA-FL Epi-Fluorescence Illuminator Module Nikon TC-S-SR Specimen Stage with C-S-HU Universal Holder Nikon Ti2-CTRE Microscope Controller Hamamatsu C11440-42U30 ORCA-Flash4.0LT+ CMOS Camera Lumencor Sola SE 5-LCR-VB Light Engine with Light Engine Control 1   135595 Nikon   Nikon   V-12  Metrology Equipment - Other in Metrology Equipment Nikon V-12 Profile Projector: Profile Projector Optical Comparator 1   61043 Nikon   Nikon   Optiphot  Wafer Inspection Microscopes in Optical Microscopes Nikon/Semprex Measuring Microscope:  NIKON/SEMPREX Wafer Measuring Microscope 4 Position Turret NIKON MPlan 2.5X, BDPlan 10X, 20X & 40X Objective Lenses NIKON Binocular Viewing Head with 10X Widefield Eyepieces NIKON Vertical Illuminator with 12V/50W Halogen Lamp Housing Brightfield & Darkfield Channels Dual Iris Apertures NIKON Model UN Illumination Transformer SEMPREX Microscope Stand Specimen Stage 6” X 6.75” 2ea Mitutoyo 164-136 Digital Micrometers for XY Measurement 0-2” in X Axis & 0-1.5” in Y Axis; Resolution to 0.0001” Mitutoyo 534-223-1 Digital Micrometer for Height Measurement 0-1” in Z Axis; Resolution to 0.0001” 1   F* 160214 Olympus   Olympus   BH-BHM  Wafer Inspection Microscopes in Optical Microscopes Olympus BH-BHM Microscope: Wafer Inspection Microscope 1   F* 252331 Olympus   Olympus   MX-80  Wafer Inspection Microscopes in Optical Microscopes Olympus MX-80 Wafer Inspection Microscope: Olympus MX-80 Wafer Inspection Microscope Motorized Stage for up to 300mm Wafers Bright/Darkfield Optics: 5X, 20X & 50X Neo SPlan NIC, 100X MSPlan and 150X MDPlan  Objective Lenses Interference Contrast Optical System Trinocular Viewing Head with Color CCD Camera & Monitor 1   N* 248944 Olympus   Olympus   MX50  Wafer Inspection Microscopes in Optical Microscopes Olympus MX50 Wafer Inspection Microscope: OLYMPUS MX50A-F  Reflected Light Microscope Five Position Motorized Turret with the Following Objective Lenses: OLYMPUS MPlanFl N 5X/0.15 BD OLYMPUS UMPlanFl 10X/0.30 BD OLYMPUS LMPlanFl 20X/0.40 BD OLYMPUS LMPlanFl 50X /0.50 BD OLYMPUS Trinocular Head with 2ea OLYMPUS WH10X Eyepieces OLYMPUS DBX Extension Tube with DIAGNOSTIC INST. 1.0X C Mount Adapter PIXELINK PL-B777U Solid State Camera Specimen Stage with 150mm X 150mm XY Travel OLYMPUS MX-LSH Lamp House with 12V 100W Halogen Lamp 100/115VAC 50/60Hz Input Voltage   1   120405 Olympus   Olympus   SZ3060  Stereo Microscopes in Optical Microscopes Olympus SZ3060: StereoZoom Microscope 1   F* 120406 Olympus   Olympus   SZ3060  Stereo Microscopes in Optical Microscopes Olympus SZ3060: StereoZoom Microscope 1   F* 172746 Plasmos   Plasmos   SD 2004  Ellipsometers in Film Thickness Testers Plasmos SD-2004 Multi-Wavelength Ellipsometer: Plasmos SD-2004 Multi-Wavelength Ellipsometer 1   179535 Plasmos   Plasmos   SD2000  Ellipsometers in Film Thickness Testers 1   50006 Sagax   Sagax   Isoscope 125  Ellipsometers in Film Thickness Testers Sagax Isoscope 125: Ellipsometer 1   241435 Sloan   Sloan   Dektak 3ST Auto 1  Profilometers in Film Thickness Testers Sloan Dektak3ST Surface Profile Measuring System: Sloan Dektak3ST Auto 1 Surface Profile Measuring System For Step Height & Surface Texture Measurement Self-Contained, Small Footprint Design Joystick Controlled Scanning Stage  8000 Data Points Specimen Stage: 6.5”(dia.); 6”X Axis X 3”Y Axis Travel; 360° θ Maximum Sample Thickness: 1.5” Measurement Display Range: 100Å to 1,310KÅ Vertical Resolution: 1Å/65KÅ; 10Å/655KÅ; 20Å/1310KÅ Stylus Force Range: 1mg to 40mg Scan Length Range: 50m to 50mm Scan Time Range: 3 to 50 Seconds Video Zoom Range: 60X to 420X (Motorized) 1   179531 Solid State Measrmnt   Solid State Measrmnt   470i  CV Plotters in Metrology Equipment 1   50017 KLA-Tencor   KLA-Tencor   Surfscan 4500  Unpatterned Wafer Inspection in Surface Inspection Tencor Surfscan 4500: TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool Cassette to Cassette Handling of 3” – 6” Wafers New HeNe 2mW Laser, 632.8 nm Wavelength New HeNe Laser Power Supply 2 µ Particle Size Sensitivity Automatic Calibration Flatscreen Monitor System Calibrated & Demonstrated Calibration Standard Wafer Included 1 45,000.00 249591 Tencor   Tencor   Surfscan 5500  Unpatterned Wafer Inspection in Surface Inspection Tencor Surfscan 5500 Unpatterned Wafer Surface Inspection Tool: Tencor Surfscan 5500 Unpatterned Wafer Surface Inspection Tool 1   23995 Vision Engineering   Vision Engineering   Dynascope  Microscopes - Other in Optical Microscopes Vision Engineering - Dynascope: Projection Microscope 1   245328 Zeiss   Zeiss   Smartzoom 5  Microscopes - Other in Optical Microscopes Zeiss Smartzoom 5 Digital Microscope: Zeiss Smartzoom 5 Digital Microscope Zeiss Model D Tiltable Stand (G) Item No. 430040-9000-000 Motorized Z-Drives for Focusing & Pivot Point Adjustment Tilting angle ≤ 45° Zeiss Smartzoom 5 Optical Engine (G) Item No. 425525-9010-000  Integrated 10x Zoom Integrated Coaxial LED illumination Integrated CMOS Camera Zeiss 10X Plan Apo D Objective Part No. 435230-9040-000 NA = 0.6, FWD 10 mm Integrated Segmented LED Illumination Integrated Data Output on Magnification & Optical Correction Factors Zeiss 1.6X Plan Apo Objective NA = 0.1, FWD 36 mm Integrated Segmented LED Illumination Integrated Data Output on Magnification & Optical Correction Factors Zeiss Scanning Stage D 130 X 100 STEP Item No. 432038-9000-000 Stage Flat Surface Area: 310 mm X 223 mm XY Travel: 130 mm X 100 mm Absolute Accuracy: +/- 5 µm Reproducibility: ≤ 1 µm Stepper Motor with 4 mm Spindle Pitch Integrated Controller Interchangeable Stage Inserts: 160 mm X 116 mm Metal Stage Insert Included Lenovo ThinkCentre All-in-One Control PC for Smartzoom 5 Item No. 432915-9105-000 Full HD 24” Display & Integrated PC with Windows 10 2019 LTSC includes Smartzoom Acquisition 2D/3D Measurement & Reporting Software with 3D/EDF (Extended Depth of Focus) Imaging 3D/EDF Stitching & Job Mode with Individual Referencing Data, Configuration & System Calibration 1

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

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