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	View All Offers Under Metrology Equipment » Switch Major Category		Click an item's ID# below for its full specifications , or: Group Offers into sub-categories under Metrology Equipment List all 58 product types under Metrology Equipment

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Item ID  Photo Short Description Product Type / Details # Price Notes Make Model   $   110263 ADE   ADE   Episcan 1000  FT-IR Spectrometers in Spectrometers ADE Episcan 1000: ADE Episcan 1000 Film Thickness Measurement & Mapping Tool Measurement of Epi Films <25µ ON-LINE TECHNOLOGIES 2110 Spectrometer Head IRVINE OPTICAL Nanoloader II Dual Cassette Wafer Handler ADE ACS Controller Windows NT Operating System Price.............................................................................$75,000.00 As-Is Price....................................................................$40,000.00 1   F* 159266 Bausch & Lomb   Bausch & Lomb   SZ4  Stereo Microscopes in Optical Microscopes Bausch & Lomb Stereo Zoom 4: StereoZoom 4 Microscope with Boom Stand 1   F* 161016 Bausch & Lomb   Bausch & Lomb   StereoZoom 4  Stereo Microscopes in Optical Microscopes Bausch & Lomb StereoZoom 4: Microscope on Small Base 1   161018 Bausch & Lomb   Bausch & Lomb   StereoZoom 6 Plus  Stereo Microscopes in Optical Microscopes Bausch & Lomb StereoZoom 6 Plus: Microscope Head 1   F* 159267 Bausch & Lomb   Bausch & Lomb   SZ 6-ST  Stereo Microscopes in Optical Microscopes Bausch & Lomb StereoZoom 6-ST: StereoZoom Microscope with Boom Stand 1   157435 Bausch & Lomb   Bausch & Lomb   StereoZoom 7  Stereo Microscopes in Optical Microscopes BAUSCH & LOMB StereoZoom 7: Microscope & Boom Stand 1   F* 231442 Bio-Rad Q7 Overlay Metrology Tool  Bio-Rad Q7 Overlay Metrology Tool  Metrology Equipment - Other in Metrology Equipment Bio-Rad Q7 Overlay Metrology Tool: Bio-Rad Q7 Overlay Metrology Tool 1   219230 Bio-Rad   Bio-Rad   Q8  Metrology Equipment - Other in Metrology Equipment Bio-Rad Q8 Overlay Metrology Tool: Bio-Rad Q8 Overlay Metrology Tool 1   225795 Bio-Rad   Bio-Rad   QS-1200  FT-IR Spectrometers in Spectrometers Bio-Rad QS-1200 FT-IR Spectrometer: BIORAD QS-1200 Automated FT-IR Spectrometer Non-Destructive Measurement of Epitaxial Silicon Films PIKE TECHNOLOGIES MAP300 Automatic Scanning Stage Manual Loading for up to 300mm Wafers 320 Test Points, 5mm Minimum Edge Exclusion & 3D Wafer Mapping FTS-175 Optical Bench Dynamically Tuned Beam Splitter NKBr Beam Splitter Dual Frequency IR Source Upgraded HeNe Laser System Control PC with Windows XP, 320G HD & 1G RAM Win-IR Pro (Rev. 2.51) Application Software QS-500 Epi (Rev. 1.31) Application Software Microsoft Access Database Application System Software, Applications Software & Site Preparation Manuals Included Refurbished & Fully Functional 1 110,000.00 121504 Bio-Rad   Bio-Rad   Q5  Overlay Registration in Critical Dimension Measurement Equipment Biorad Q5: Overlay Registration Tool 2   31390 Bio-Rad   Bio-Rad   Q5  Overlay Registration in Critical Dimension Measurement Equipment BioRad Q5: Overlay Registration Tool - Has Been Upgraded to a Q6 CD Measurement, Single and Two-Axis Overlay Registration 1   F* 54652 Bio-Rad   Bio-Rad   Q7/Q8  Overlay Registration in Critical Dimension Measurement Equipment BioRad Q7/Q8 Overlay Metrology Tool: Overlay Metrology Tool for up to 200mm Wafers 1   F* 144802 CR Technology   CR Technology   UF160/0  Xray Fluorescence Spectrometers in Spectrometers CR Technology XRay System UF160/0: XRAY Wafer Analyzer 1   194899 DELTRONIC   DELTRONIC   DH14-RR  Measuring Microscopes in Optical Microscopes Deltronic DH14-RR Profile Projector : Deltronic DH14-RR Profile Projector  20X Objective Lens 1   159268 Diagnostic Instrumts   Diagnostic Instrumts     Stereo Microscopes in Optical Microscopes Diagnostic Instruments: Microscope Boom Stand 2   238938 Four Dimensions   Four Dimensions   CV92A  CV Plotters in Metrology Equipment Four Dimensions CV92A Semiautomatic CV Plotter: Four Dimensions CV92A Semiautomatic CV Plotter Mercury Probe System Control Computer Embedded Computer 1 50,000.00 49926 GCA/Tropel   GCA/Tropel   9000  Unpatterned Wafer Inspection in Surface Inspection GCA/TROPEL 9000: Surface Flatness Analyzer 1   35762 Hitachi   Hitachi   S-7000  Critical Dimension Scanning Electron Microscopes in Critical Dimension Measurement Equipment Hitachi S-7000: CD SEM Measurement Tool 1   F* 218321 KLA-Tencor   KLA-Tencor   AIT  Patterned Wafer Inspection in Surface Inspection KLA-Tencor AIT Patterned Wafer Inspection Tool: KLA-Tencor AIT Patterned Wafer Inspection Tool Call for Details 1   104306 KLA-Tencor   KLA-Tencor   AlphaStep 300  Profilometers in Film Thickness Testers KLA-Tencor AlphaStep 300 Profilometer: Profilometer 1   159451 Nicolet   Nicolet   Magna-IR 550  FT-IR Spectrometers in Spectrometers NICOLET Magna-IR 550: FT-IR Spectrometer 1   F* 212138 Nikon   Nikon   Optiphot 150  Wafer Inspection Microscopes in Optical Microscopes Nikon Optiphot 150 Wafer Inspection Microscope: Nikon Optiphot 150 Wafer Inspection Microscope Motorized Turret Rotation 10X, 20X, 50X & 100X CF Plan BF/DF Objective Lenses DIC Filter Slots on Turret (Polarizer & Analyzer Not Included)  Binocular Head with 10X WF Eyepieces Wafer Stage for Use with Nikon NWL Wafer Loader 12V/50W Lamphouse with Internal Illumination Transformer 1   179537 Nikon   Nikon   Optiphot 150  Wafer Inspection Microscopes in Optical Microscopes Nikon Optiphot 150 Wafer Inspection Microscope: Nikon Optiphot 150 Wafer Inspection Microscope  1   155646 Nikon   Nikon   Optiphot 200  Wafer Inspection Microscopes in Optical Microscopes Nikon Optiphot 200: NIKON Optiphot 200 Wafer Inspection Stand, Including Focus Mechanism Interference Contrast Polarizer/Analyzer 1   217690 Nikon   Nikon   Optiphot 200  Wafer Inspection Microscopes in Optical Microscopes Nikon Optiphot 200 Wafer Inspection Microscope:  Nikon Optiphot 200 Wafer Inspection Microscope Bright/Darkfield with Interference Contrast   Prior Proscan Stage with Joystick & 200mm X 200mm XY Travel Motorized Turret with 5ea Objective Lenses  NMH-1 Illumination Source 1   241416 Nikon   Nikon   Optiphot 200/NWL 860  Wafer Inspection Microscopes in Optical Microscopes Nikon Optiphot 200 Wafer Inspection Microscope with NWL 860 Wafer Loader: Nikon Optiphot 200 Wafer Inspection Microscope with NWL 860 Wafer Loader Bright/Darkfield Objective Lenses CF Plan 2.5X, 5X, 10X, 20X & 50X  Nikon NWL 860 Automatic Wafer Loader Ergonomic Trinocular Viewing Head with CFUWN10X/25 Eyepieces & 1X/16 TV Relay Lens 1   120404 Nikon   Nikon   Optiphot 88  Wafer Inspection Microscopes in Optical Microscopes Nikon Optiphot 88: NIKON Optiphot-88 Wafer Inspection Microscope   5 Position Turret with Motorized Rotation BDPlan 5X, 10X, 20X, 40X & 100X Bright/Darkfield Objective Lenses Trinocular Viewing Head with 10X Widefield Eyepieces C-Mount with Television Lens Included Vertical Illuminator with 12V/50W Halogen Lamp Housing Brightfield & Darkfield Channels Dual Iris Apertures Specimen Stage with 200mm X 200mm XY Travel 1   124185 Nikon   Nikon   Optistation 3  Automatic Wafer Inspection Tools in Microscope Inspection Tools Nikon Optistation 3: Wafer Inspection Tool for 6" Wafers 1   131378 Nikon   Nikon   Optistation 3  Automatic Wafer Inspection Tools in Microscope Inspection Tools Nikon Optistation 3: Wafer Inspection Tool for 6" Wafers 1   86230 Nikon   Nikon   Optistation 3  Automatic Wafer Inspection Tools in Microscope Inspection Tools Nikon Optistation 3: Automatic Wafer Inspection Station 1   87091 Nikon   Nikon   Optistation 3A  Automatic Wafer Inspection Tools in Microscope Inspection Tools Nikon Optistation 3A: Automatic Wafer Inspection Station 1   135595 Nikon   Nikon   V-12  Metrology Equipment - Other in Metrology Equipment Nikon V-12 Profile Projector: Profile Projector Optical Comparator 1   61043 Nikon   Nikon   Optiphot  Wafer Inspection Microscopes in Optical Microscopes Nikon/Semprex Measuring Microscope:  NIKON/SEMPREX Wafer Measuring Microscope 4 Position Turret NIKON MPlan 2.5X, BDPlan 10X, 20X & 40X Objective Lenses NIKON Binocular Viewing Head with 10X Widefield Eyepieces NIKON Vertical Illuminator with 12V/50W Halogen Lamp Housing Brightfield & Darkfield Channels Dual Iris Apertures NIKON Model UN Illumination Transformer SEMPREX Microscope Stand Specimen Stage 6” X 6.75” 2ea Mitutoyo 164-136 Digital Micrometers for XY Measurement 0-2” in X Axis & 0-1.5” in Y Axis; Resolution to 0.0001” Mitutoyo 534-223-1 Digital Micrometer for Height Measurement 0-1” in Z Axis; Resolution to 0.0001” 1   F* 160214 Olympus   Olympus   BH-BHM  Wafer Inspection Microscopes in Optical Microscopes Olympus BH-BHM Microscope: Wafer Inspection Microscope 1   F* 120405 Olympus   Olympus   SZ3060  Stereo Microscopes in Optical Microscopes Olympus SZ3060: StereoZoom Microscope 1   F* 120406 Olympus   Olympus   SZ3060  Stereo Microscopes in Optical Microscopes Olympus SZ3060: StereoZoom Microscope 1   F* 172746 Plasmos   Plasmos   SD 2004  Ellipsometers in Film Thickness Testers Plasmos SD-2004 Multi-Wavelength Ellipsometer: Plasmos SD-2004 Multi-Wavelength Ellipsometer 1   179535 Plasmos   Plasmos   SD2000  Ellipsometers in Film Thickness Testers 1   50006 Sagax   Sagax   Isoscope 125  Ellipsometers in Film Thickness Testers Sagax Isoscope 125: Ellipsometer 1   241435 Sloan   Sloan   Dektak 3ST Auto 1  Profilometers in Film Thickness Testers Sloan Dektak3ST Surface Profile Measuring System: Sloan Dektak3ST Auto 1 Surface Profile Measuring System For Step Height & Surface Texture Measurement Self-Contained, Small Footprint Design Joystick Controlled Scanning Stage  8000 Data Points Specimen Stage: 6.5”(dia.); 6”X Axis X 3”Y Axis Travel; 360° θ Maximum Sample Thickness: 1.5” Measurement Display Range: 100Å to 1,310KÅ Vertical Resolution: 1Å/65KÅ; 10Å/655KÅ; 20Å/1310KÅ Stylus Force Range: 1mg to 40mg Scan Length Range: 50m to 50mm Scan Time Range: 3 to 50 Seconds Video Zoom Range: 60X to 420X (Motorized) 1   179531 Solid State Measrmnt   Solid State Measrmnt   470i  CV Plotters in Metrology Equipment 1   50017 KLA-Tencor   KLA-Tencor   Surfscan 4500  Unpatterned Wafer Inspection in Surface Inspection Tencor Surfscan 4500: TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool Cassette to Cassette Handling of 3” – 6” Wafers New HeNe 2mW Laser, 632.8 nm Wavelength New HeNe Laser Power Supply 2 µ Particle Size Sensitivity Automatic Calibration Flatscreen Monitor System Calibrated & Demonstrated Calibration Standard Wafer Included 1 45,000.00 23995 Vision Engineering   Vision Engineering   Dynascope  Microscopes - Other in Optical Microscopes Vision Engineering - Dynascope: Projection Microscope 1

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

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