more...
	Serving  Our Guest Log in   Register to bid, list, and trade   Submit items to sell

ALL CATEGORIES   Metrology Eq

View   Search-by-Specs

	View All Offers Under Film Thickness Testers » Switch Major Category		Click an item's ID# below for its full specifications , or: Group Offers into sub-categories under Film Thickness Testers List all 12 product types under Film Thickness Testers

To sort on a column, click the column head; click it again to reverse the sort. Click the links under the Product Type column head to see other like items of that type.

Item ID  Photo Short Description Product Type / Details # Price Notes Make Model   $   110263 ADE   ADE   Episcan 1000  FT-IR Spectrometers in Spectrometers ADE Episcan 1000: ADE Episcan 1000 Film Thickness Measurement & Mapping Tool Measurement of Epi Films <25µ ON-LINE TECHNOLOGIES 2110 Spectrometer Head IRVINE OPTICAL Nanoloader II Dual Cassette Wafer Handler ADE ACS Controller Windows NT Operating System Price.............................................................................$75,000.00 As-Is Price....................................................................$40,000.00 1   F* 225795 Bio-Rad   Bio-Rad   QS-1200  FT-IR Spectrometers in Spectrometers Bio-Rad QS-1200 FT-IR Spectrometer: BIORAD QS-1200 Automated FT-IR Spectrometer Non-Destructive Measurement of Epitaxial Silicon Films PIKE TECHNOLOGIES MAP300 Automatic Scanning Stage Manual Loading for up to 300mm Wafers 320 Test Points, 5mm Minimum Edge Exclusion & 3D Wafer Mapping FTS-175 Optical Bench Dynamically Tuned Beam Splitter NKBr Beam Splitter Dual Frequency IR Source Upgraded HeNe Laser System Control PC with Windows XP, 320G HD & 1G RAM Win-IR Pro (Rev. 2.51) Application Software QS-500 Epi (Rev. 1.31) Application Software Microsoft Access Database Application System Software, Applications Software & Site Preparation Manuals Included Refurbished & Fully Functional 1 110,000.00 144802 CR Technology   CR Technology   UF160/0  Xray Fluorescence Spectrometers in Spectrometers CR Technology XRay System UF160/0: XRAY Wafer Analyzer 1   104306 KLA-Tencor   KLA-Tencor   AlphaStep 300  Profilometers in Film Thickness Testers KLA-Tencor AlphaStep 300 Profilometer: Profilometer 1   247843 KLA-Tencor   KLA-Tencor   UV-1050  Film Thickness Testers - Other in Film Thickness Testers KLA-Tencor UV-1050 Thin Film Measurement Tool: KLA-Tencor UV-1050 Thin Film Measurement Tool Cassette to Cassette Wafer Handling Wafer sizes: 100mm, 150mm & 200mm Broadband UV Optics Dual Beam Spectrophotometry Applications: Polysilicon, UV Reflectivity & Simultaneous Oxide and TiN Thickness for CMP System Control PC with Windows NT OS Summit Application Software GEM / SECS Communication System Installation at Destination Included 1 55,000.00 N* 159451 Nicolet   Nicolet   Magna-IR 550  FT-IR Spectrometers in Spectrometers NICOLET Magna-IR 550: FT-IR Spectrometer 1   F* 172746 Plasmos   Plasmos   SD 2004  Ellipsometers in Film Thickness Testers Plasmos SD-2004 Multi-Wavelength Ellipsometer: Plasmos SD-2004 Multi-Wavelength Ellipsometer 1   179535 Plasmos   Plasmos   SD2000  Ellipsometers in Film Thickness Testers 1   50006 Sagax   Sagax   Isoscope 125  Ellipsometers in Film Thickness Testers Sagax Isoscope 125: Ellipsometer 1   241435 Sloan   Sloan   Dektak 3ST Auto 1  Profilometers in Film Thickness Testers Sloan Dektak3ST Surface Profile Measuring System: Sloan Dektak3ST Auto 1 Surface Profile Measuring System For Step Height & Surface Texture Measurement Self-Contained, Small Footprint Design Joystick Controlled Scanning Stage  8000 Data Points Specimen Stage: 6.5”(dia.); 6”X Axis X 3”Y Axis Travel; 360° θ Maximum Sample Thickness: 1.5” Measurement Display Range: 100Å to 1,310KÅ Vertical Resolution: 1Å/65KÅ; 10Å/655KÅ; 20Å/1310KÅ Stylus Force Range: 1mg to 40mg Scan Length Range: 50m to 50mm Scan Time Range: 3 to 50 Seconds Video Zoom Range: 60X to 420X (Motorized) 1

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.