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FULL DESCRIPTION of Item 54633

in Other Metrology Equipment
Item ID: 54633

Offered 1 Offered at Best Price


SDI SPV-300

Wafer Characterization Tool for up to 300mm Wafers - Parts Tool Only

SDI SPV-300
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Location: Plano, Texas, United States
Unit Price Unstated
Number of Units 1
Manufacturer SDI Diagnostics Inc
Model SPV-300
Description Wafer Characterization Tool
Other Information 
  • Serial Number 97-070148
  • Contact and Non-Contact Surface Photo Voltage Test Capability
  • For Analyzing 200mm & 300mm Wafers
  • Light Activation Module
  • SDI Control Fe Activation Controller
  • Dual Halogen Lamp Housings
  • Wafer Analysis Module
  • Reference Light Module
  • Halogen Lamp Housing
  • EG&G PAR 197 Light Chopper
  • Fiber Optic Light Delivery
  • Wafer Analysis Chuck
  • 200mm (dia.) Anodized Aluminum Wafer Chuck
  • Calibration Chip Fixture
  • SDI LPS-12 Power Supply
  • SDI Opto Coupler
  • 2ea NEWPORT RESEARCH MM3000 Motion Controllers
  • HEWLETT PACKARD Vectra XA Computer
  • 3.5” Floppy Disc Drive / CD-ROM Drive
  • SYQUEST ezflyer 230GB Backup Tape Drive
  • 15” Color LCD Monitor
Year of Manufacture 1997