| Item ID |
Short Description |
Product Type / Details |
#
|
Price |
Note |
| Make |
Model |
| |
|
$ |
|
 |
110263 |
ADE |
Episcan 1000 |
in Spectrometers
|
1
|
|
|
  |
| |
ADE Episcan 1000 Film Thickness Measurement & Mapping Tool |
 |
104748 |
Bio-Rad |
QS-312 |
in Spectrometers
|
1
|
|
|
  |
| |
BioRad QS-312 BioRad QS-312 FTIR Spectrometer |
 |
74140 |
Bio-Rad |
QS-408M |
in Spectrometers
|
1
|
|
|
  |
| |
BioRad QS-408M - PARTS TOOL ONLY Manual FT-IR (Fourier Transform Infrared Spectrophotometer) for Epi Measurement - 200mm Wafers |
 |
125630 |
KLA-Tencor |
AlphaStep 200 |
in Film Thickness Testers
|
1
|
|
|
N* |
| |
KLA-Tencor Alpha-Step 200 Profilometer |
 |
104306 |
KLA-Tencor |
AlphaStep 300 |
in Film Thickness Testers
|
1
|
|
|
  |
| |
KLA-Tencor AlphaStep 300 Profilometer Profilometer |
 |
88268 |
KLA-Tencor |
SpectraFx 200 |
in Film Thickness Testers
|
1
|
|
|
  |
| |
KLA-Tencor SpectraFx 200 Optical Thin-Film Metrology System |
 |
10354 |
Nanometrics |
NanoSpec AFT |
in Spectrophotometers
|
1
|
|
|
 |
| |
Nanometrics NanoSpec AFT PARTS TOOL ONLY |
 |
61871 |
Nanometrics |
NanoSpec 181 |
in Spectrophotometers
|
1
|
|
|
F* |
| |
Nanometrics NanoSpec AFT #010-0181 Film Thickness Analyzers |
 |
61872 |
Nanometrics |
NanoSpec 181 |
in Spectrophotometers
|
1
|
|
|
F* |
| |
Nanometrics NanoSpec AFT #010-0181 Film Thickness Analyzers |
 |
116240 |
Nanometrics |
NanoSpec AFT 2100 |
in Spectrophotometers
|
1
|
|
|
  |
| |
Nanometrics NanoSpec AFT 2100 Automatic Film Thickness System |
 |
116241 |
Nanometrics |
NanoSpec AFT 212 |
in Spectrophotometers
|
1
|
|
|
  |
| |
Nanometrics NanoSpec AFT 212 Automatic Film Thickness System |
 |
77964 |
Philips SPW-2800 |
in Spectrometers
|
1
|
|
|
  |
| |
Philips SPW-2800 High-Precision Wafer Analyzer |
 |
46596 |
RIGAKU 3630 |
in Spectrometers
|
1
|
|
|
F* |
| |
RIGAKU 3630 TXRF WAFER/DISK ANALYZER |
 |
122734 |
Rigaku |
3630 |
in Spectrometers
|
1
|
|
|
 |
| |
Rigaku 3630 Xray Fluorescence Spectrometer |
 |
53290 |
Rigaku 3630 Xray Fluorescence Spectrometer |
in Spectrometers
|
1
|
|
|
  |
| |
Rigaku 3630 Xray Fluorescence Spectrometer TXRF Wafer Analyzer |
 |
54993 |
Rigaku 3700H |
in Spectrometers
|
1
|
|
|
  |
| |
Rigaku 3700H TXRF Wafer Analyzer |
 |
53291 |
Rigaku 3750 |
in Spectrometers
|
1
|
|
|
  |
| |
Rigaku 3750 TXRF Wafer Analyzer |
 |
50006 |
Sagax Isoscope 125 |
in Film Thickness Testers
|
1
|
|
|
  |
| |
Sagax Isoscope 125 Ellipsometer |
 |
110274 |
Veeco Instruments,In |
Dektak 3-30 |
in Film Thickness Testers
|
1
|
|
|
 |
| |
Veeco Dektak 3-30 Profilometer Surface Profile Measuring System |
 |
96384 |
Veeco Instruments,In |
Dektak 3030 |
in Film Thickness Testers
|
1
|
|
|
  |
| |
Veeco Dektak 3030 Profilometer Surface Profile Measuring System |
 |
50026 |
Veeco Instr Inc |
Dektak I |
in Film Thickness Testers
|
1
|
|
|
F* |
| |
Veeco Dektak I Profilometer PARTS TOOL ONLY |
 |
50011 |
Veeco Instr Inc |
Dektak IIA |
in Film Thickness Testers
|
1
|
|
|
F* |
| |
Veeco Dektak IIA Profilometer |