 |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Make |
Model |
|
|
$ |
|
 |
110263
|
ADE
|
ADE |
Episcan 1000 |
in Spectrometers
ADE Episcan 1000:ADE Episcan 1000 Film Thickness Measurement & Mapping Tool - Measurement of Epi Films <25µ
- ON-LINE TECHNOLOGIES 2110 Spectrometer Head
- IRVINE OPTICAL Nanoloader II Dual Cassette Wafer Handler
- ADE ACS Controller
- Windows NT Operating System
- Price.............................................................................$75,000.00
- As-Is Price....................................................................$40,000.00
|
1
|
|
|
F* |
|
 |
225795
|
Bio-Rad
|
Bio-Rad |
QS-1200 |
in Spectrometers
Bio-Rad QS-1200 FT-IR Spectrometer:BIORAD QS-1200 Automated FT-IR Spectrometer - Non-Destructive Measurement of Epitaxial Silicon Films
- PIKE TECHNOLOGIES Mapp300 Automatic Scanning Stage
- Manual Loading for up to 300mm Wafers
- 320 Test Points, 5mm Minimum Edge Exclusion & 3D Wafer Mapping
- FTS-575C Optical Bench
- Dynamically Tuned Beam Splitter
- New KBr Beam Splitter
- Dual Frequency IR Source
- Upgraded HeNe Laser
- System Control PC with Windows XP, 320G HD & 1G RAM
- Win-IR Pro (Rev. 2.51) Application Software
- QS-500 Epi (Rev. 1.31) Application Software
- Microsoft Access Database Application
- System Software, Applications Software & Site Preparation Manuals Included
- Refurbished & Fully Functional
|
1
|
|
100,000.00 |
 |
|
 |
144802
|
CR Technology
|
CR Technology |
UF160/0 |
in Spectrometers
CR Technology XRay System UF160/0:XRAY Wafer Analyzer
|
1
|
|
|
|
|
 |
104306
|
KLA-Tencor
|
KLA-Tencor |
AlphaStep 300 |
in Film Thickness Testers
KLA-Tencor AlphaStep 300 Profilometer:Profilometer
|
1
|
|
|
 |
|
 |
159451
|
Nicolet
|
Nicolet |
Magna-IR 550 |
in Spectrometers
NICOLET Magna-IR 550:FT-IR Spectrometer
|
1
|
|
|
F* |
|
 |
172746
|
Plasmos
|
Plasmos |
SD 2004 |
in Film Thickness Testers
Plasmos SD-2004 Multi-Wavelength Ellipsometer:Plasmos SD-2004 Multi-Wavelength Ellipsometer
|
1
|
|
|
|
|
 |
179535
|
Plasmos
|
Plasmos |
SD2000 |
in Film Thickness Testers
|
1
|
|
|
|
|
 |
122734
|
Rigaku
|
Rigaku |
3630 |
in Spectrometers
Rigaku 3630:Xray Fluorescence Spectrometer
|
1
|
|
|
|
|
 |
230560
|
Rigaku
|
Rigaku |
3640 |
in Spectrometers
Rigaku 3640 X-Ray Fluorescence Spectrometer:RIGAKU 3640 X-Ray Fluorescence Spectrometer - Serial Number WR41032 Date of Manufacture: June, 2000
- Channels Include: Ti, Si, Si (Lα), B, N, Al, P, W & Scanning Channel
- X-Ray Tube Included
- RIGAKU High Voltage Transformer
- 2ea RIGAKU Heat Exchangers
- MECS UTX 1000 3 Axis Robot
- MECS TTX 1000 Robot Controller
- MECS CS-1000 Control Systems (Onboard & Remote)
- MECS OF250 Wafer Orienter with Controller
- MKS Type 250 Controller
- MKS Type 113 Power Supply Readout
- MKS Model 627 Baratron Head
- ALCATEL ADP81 S M1 Dry Vacuum Pump
- System Control PC
- AC Control Box
- Manual Set Included
|
1
|
|
40,000.00 |
 |
|
 |
50006
|
Sagax
|
Sagax |
Isoscope 125 |
in Film Thickness Testers
Sagax Isoscope 125:Ellipsometer
|
1
|
|
|
 |
|