more...
	Serving  Our Guest Log in   Register to bid, list, and trade   Submit items to sell

ALL CATEGORIES   Metrology Eq

View   Search-by-Specs

	View All Offers Under Film Thickness Testers » Switch Major Category		Click an item's ID# below for its full specifications , or: Group Offers into sub-categories under Film Thickness Testers List all 12 product types under Film Thickness Testers

To sort on a column, click the column head; click it again to reverse the sort. Click the links under the Product Type column head to see other like items of that type.

Item ID  Photo Short Description Product Type / Details # Price Notes Make Model   $   110263 ADE   ADE   Episcan 1000  FT-IR Spectrometers in Spectrometers ADE Episcan 1000: ADE Episcan 1000 Film Thickness Measurement & Mapping Tool Measurement of Epi Films <25µ ON-LINE TECHNOLOGIES 2110 Spectrometer Head IRVINE OPTICAL Nanoloader II Dual Cassette Wafer Handler ADE ACS Controller Windows NT Operating System Price.............................................................................$75,000.00 As-Is Price....................................................................$40,000.00 1   F* 225795 Bio-Rad   Bio-Rad   QS-1200  FT-IR Spectrometers in Spectrometers Bio-Rad QS-1200 FT-IR Spectrometer: BIORAD QS-1200 Automated FT-IR Spectrometer Non-Destructive Measurement of Epitaxial Silicon Films PIKE TECHNOLOGIES MAP300 Automatic Scanning Stage Manual Loading for up to 300mm Wafers 320 Test Points, 5mm Minimum Edge Exclusion & 3D Wafer Mapping FTS-175 Optical Bench Dynamically Tuned Beam Splitter NKBr Beam Splitter Dual Frequency IR Source Upgraded HeNe Laser System Control PC with Windows XP, 320G HD & 1G RAM Win-IR Pro (Rev. 2.51) Application Software QS-500 Epi (Rev. 1.31) Application Software Microsoft Access Database Application System Software, Applications Software & Site Preparation Manuals Included Refurbished & Fully Functional 1 110,000.00 144802 CR Technology   CR Technology   UF160/0  Xray Fluorescence Spectrometers in Spectrometers CR Technology XRay System UF160/0: XRAY Wafer Analyzer 1   249592 J. A. Woollam   J. A. Woollam   M-2000  Ellipsometers in Film Thickness Testers J.A. Woollam M-2000 Spectroscopic Ellipsometer: J.A. Woollam M-2000 Spectroscopic Ellipsometer 1   249729 J.A. Woollam VB-200 Spectroscopic Ellipsometer  J.A. Woollam VB-200 Spectroscopic Ellipsometer  Ellipsometers in Film Thickness Testers J.A. Woollam VB-200 Spectroscopic Ellipsometer: J.A. Woollam VB-200 Spectroscopic Ellipsometer 1   254093 KLA-Tencor   KLA-Tencor   Aleris 8350  Film Thickness Testers - Other in Film Thickness Testers KLA-TENCOR Aleris 8350 Advanced Film Metrology Tool: KLA-TENCOR Aleris 8350 Advanced Film Metrology Tool Dual 300 mm Loadports Wafer Level Reliability Broadband Spectroscopic Ellipsometer Single Wave Ellipsometer Stress Measurement iDesorber 1   250811 KLA-Tencor   KLA-Tencor   Aleris 8350  Film Thickness Testers - Other in Film Thickness Testers KLA-TENCOR Aleris 8350 Film Metrology Tool: KLA-TENCOR Aleris 8350 Advanced Film Metrology Tool Dual 300 mm Loadports Wafer Level Reliability Broadband Spectroscopic Ellipsometer Single Wave Ellipsometer Stress Measurement iDesorber 1   104306 KLA-Tencor   KLA-Tencor   AlphaStep 300  Profilometers in Film Thickness Testers KLA-Tencor AlphaStep 300 Profilometer: Profilometer 1   249589 KLA-Tencor   KLA-Tencor   ASET-F5x  Film Thickness Testers - Other in Film Thickness Testers KLA-Tencor ASET-F5x Thin Film Measurement System: KLA-TENCOR ASET-F5x Thin Film Measurement System Serial Number 0202802R Manufactured in June, 2002 Inspection Modes Include: Dual Beam Spectrometry Spectroscopic Ellipsometry Film Stress Analysis SUMMIT™ Application Software Version 3.21.16 FTML Version 3.46.06 Model 300DFF1P Wafer Loading Platform Dual Loadports for 300mm Wafers Three Axis Wafer Handling Robot GEM / SECS Communication Inquire for Additional Details 2   250812 KLA-Tencor   KLA-Tencor   HRP-240  Profilometers in Film Thickness Testers KLA-TENCOR HRP-240 High Resolution Profiler: KLA-TENCOR HRP-240 High Resolution Profiler Cassette to Cassette Wafer Handling for up to 200mm Wafers Previously Configured for SMIF Wafer Handling Please Inquire for Additional Details 1   250822 KLA-Tencor   KLA-Tencor   SWE Kit  Ellipsometers in Film Thickness Testers KLA-TENCOR Spectra fx SWE Kit: KLA-TENCOR Spectra fx Single Wave Ellipsometer Kit 1   247843 KLA-Tencor   KLA-Tencor   UV-1050  Film Thickness Testers - Other in Film Thickness Testers KLA-Tencor UV-1050 Thin Film Measurement Tool: KLA-Tencor UV-1050 Thin Film Measurement Tool Cassette to Cassette Wafer Handling Wafer sizes: 100mm, 150mm & 200mm Broadband UV Optics Dual Beam Spectrophotometry Applications: Polysilicon, UV Reflectivity & Simultaneous Oxide and TiN Thickness for CMP System Control PC with Windows NT OS Summit Application Software GEM / SECS Communication System Installation at Destination Available 1 55,000.00 248941 Nanometrics   Nanometrics   8300XSE  Ellipsometers in Film Thickness Testers Nanometrics 8300XSE Film Thickness Analyzer: Nanometrics 8300XSE Film Thickness Analyzer J.A. Woollam M-44 Spectroscopic Ellipsometer J.A. Woollam EC-270 Ellipsometer Controller J.A. Woollam LPS-420 Xenon Light Source Manual Loading of up to 300mm Wafers Yaskawa ERCR-NS01-B004 Motion Controller Please Inquire for Additional Details 1   159451 Nicolet   Nicolet   Magna-IR 550  FT-IR Spectrometers in Spectrometers NICOLET Magna-IR 550: FT-IR Spectrometer 1   F* 172746 Plasmos   Plasmos   SD 2004  Ellipsometers in Film Thickness Testers Plasmos SD-2004 Multi-Wavelength Ellipsometer: Plasmos SD-2004 Multi-Wavelength Ellipsometer 1   179535 Plasmos   Plasmos   SD2000  Ellipsometers in Film Thickness Testers 1   50006 Sagax   Sagax   Isoscope 125  Ellipsometers in Film Thickness Testers Sagax Isoscope 125: Ellipsometer 1

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.