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	View All Offers Under Film Thickness Testers » Switch Major Category		Click an item's ID# below for its full specifications , or: Group Offers into sub-categories under Film Thickness Testers List all 12 product types under Film Thickness Testers

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Item ID  Photo Short Description Product Type / Details # Price Notes Make Model   $   110263 ADE   ADE   Episcan 1000  FT-IR Spectrometers in Spectrometers ADE Episcan 1000: ADE Episcan 1000 Film Thickness Measurement & Mapping Tool Measurement of Epi Films <25µ ON-LINE TECHNOLOGIES 2110 Spectrometer Head IRVINE OPTICAL Nanoloader II Dual Cassette Wafer Handler ADE ACS Controller Windows NT Operating System Price.............................................................................$75,000.00 As-Is Price....................................................................$40,000.00 1   F* 225795 Bio-Rad   Bio-Rad   QS-1200  FT-IR Spectrometers in Spectrometers Bio-Rad QS-1200 FT-IR Spectrometer: BIORAD QS-1200 Automated FT-IR Spectrometer Non-Destructive Measurement of Epitaxial Silicon Films PIKE TECHNOLOGIES Mapp300 Automatic Scanning Stage Manual Loading for up to 300mm Wafers 320 Test Points, 5mm Minimum Edge Exclusion & 3D Wafer Mapping FTS-575C Optical Bench Dynamically Tuned Beam Splitter New KBr Beam Splitter Dual Frequency IR Source Upgraded HeNe Laser System Control PC with Windows XP, 320G HD & 1G RAM Win-IR Pro (Rev. 2.51) Application Software QS-500 Epi (Rev. 1.31) Application Software Microsoft Access Database Application System Software, Applications Software & Site Preparation Manuals Included Refurbished & Fully Functional 1 100,000.00 144802 CR Technology   CR Technology   UF160/0  Xray Fluorescence Spectrometers in Spectrometers CR Technology XRay System UF160/0: XRAY Wafer Analyzer 1   104306 KLA-Tencor   KLA-Tencor   AlphaStep 300  Profilometers in Film Thickness Testers KLA-Tencor AlphaStep 300 Profilometer: Profilometer 1   159451 Nicolet   Nicolet   Magna-IR 550  FT-IR Spectrometers in Spectrometers NICOLET Magna-IR 550: FT-IR Spectrometer 1   F* 172746 Plasmos   Plasmos   SD 2004  Ellipsometers in Film Thickness Testers Plasmos SD-2004 Multi-Wavelength Ellipsometer: Plasmos SD-2004 Multi-Wavelength Ellipsometer 1   179535 Plasmos   Plasmos   SD2000  Ellipsometers in Film Thickness Testers 1   122734 Rigaku   Rigaku   3630  Xray Fluorescence Spectrometers in Spectrometers Rigaku 3630: Xray Fluorescence Spectrometer 1   230560 Rigaku   Rigaku   3640  Xray Fluorescence Spectrometers in Spectrometers Rigaku 3640 X-Ray Fluorescence Spectrometer: RIGAKU 3640 X-Ray Fluorescence Spectrometer Serial Number WR41032 Date of Manufacture:  June, 2000 Channels Include: Ti, Si, Si (Lα), B, N, Al, P, W & Scanning Channel X-Ray Tube Included RIGAKU High Voltage Transformer 2ea RIGAKU Heat Exchangers MECS UTX 1000 3 Axis Robot MECS TTX 1000 Robot Controller MECS CS-1000 Control Systems (Onboard & Remote) MECS OF250 Wafer Orienter with Controller MKS Type 250 Controller MKS Type 113 Power Supply Readout MKS Model 627 Baratron Head ALCATEL ADP81 S M1 Dry Vacuum Pump System Control PC AC Control Box Manual Set Included 1 40,000.00 50006 Sagax   Sagax   Isoscope 125  Ellipsometers in Film Thickness Testers Sagax Isoscope 125: Ellipsometer 1

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

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