 |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Make |
Model |
|
|
$ |
|
 |
159266
|
Bausch & Lomb
|
Bausch & Lomb |
SZ4 |
in Optical Microscopes
Bausch & Lomb Stereo Zoom 4:StereoZoom 4 Microscope with Boom Stand
|
1
|
|
|
F* |
|
 |
161016
|
Bausch & Lomb
|
Bausch & Lomb |
StereoZoom 4 |
in Optical Microscopes
Bausch & Lomb StereoZoom 4:Microscope on Small Base
|
1
|
|
|
 |
|
 |
161018
|
Bausch & Lomb
|
Bausch & Lomb |
StereoZoom 6 Plus |
in Optical Microscopes
Bausch & Lomb StereoZoom 6 Plus:Microscope Head
|
1
|
|
|
F* |
|
 |
159267
|
Bausch & Lomb
|
Bausch & Lomb |
SZ 6-ST |
in Optical Microscopes
Bausch & Lomb StereoZoom 6-ST:StereoZoom Microscope with Boom Stand
|
1
|
|
|
 |
|
 |
157435
|
Bausch & Lomb
|
Bausch & Lomb |
StereoZoom 7 |
in Optical Microscopes
BAUSCH & LOMB StereoZoom 7:Microscope & Boom Stand
|
1
|
|
|
F* |
|
 |
194899
|
DELTRONIC
|
DELTRONIC |
DH14-RR |
in Optical Microscopes
Deltronic DH14-RR Profile Projector :Deltronic DH14-RR Profile Projector
|
1
|
|
|
|
|
 |
159268
|
Diagnostic Instrumts
|
Diagnostic Instrumts |
|
in Optical Microscopes
Diagnostic Instruments:Microscope Boom Stand
|
2
|
|
|
|
|
 |
49926
|
GCA/Tropel
|
GCA/Tropel |
9000 |
in Surface Inspection
GCA/TROPEL 9000:Surface Flatness Analyzer
|
1
|
|
|
 |
|
 |
35762
|
Hitachi
|
Hitachi |
S-7000 |
in Critical Dimension Measurement Equipment
Hitachi S-7000:CD SEM Measurement Tool
|
1
|
|
|
F* |
|
 |
254018
|
KLA-Tencor
|
KLA-Tencor |
2138XP |
in Microscope Inspection Tools
KLA-Tencor 2138XP Brightfield Inspection Tool:KLA-Tencor 2138XP Brightfield Defect Inspection Tool - 0.25µ, 0.39µ, 0.62µ Spot Sizes
- For 150mm & 200mm Wafers
- Model 2552UI User Interface
- Denkenseiki Noise Filter
- Please Inquire for Additional Details
|
1
|
|
|
 |
|
 |
218321
|
KLA-Tencor
|
KLA-Tencor |
AIT |
in Surface Inspection
KLA-Tencor AIT Patterned Wafer Inspection Tool:KLA-Tencor AIT Patterned Wafer Inspection Tool
|
1
|
|
|
|
|
 |
250818
|
KLA-Tencor
|
KLA-Tencor |
Puma 9120 IS |
in Surface Inspection
KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool:KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool - For 200mm or 300mm Wafers
- 2ea Cameras
- Please Inquire for Additional Details
|
1
|
|
|
 |
|
 |
250819
|
KLA-Tencor
|
KLA-Tencor |
Puma 9130 |
in Surface Inspection
KLA-TENCOR Puma 9130 Darkfield Inspection Tool:KLA-TENCOR Puma 9130 Darkfield Inspection Tool - Parts Tool
- Please Inquire for Additional Details
|
1
|
|
|
|
|
 |
250814
|
KLA-Tencor
|
KLA-Tencor |
Surfscan SP1 |
in Surface Inspection
KLA-Tencor Surfscan SP1 Unpatterned Surface Defect Tool:KLA-Tencor Surfscan SP1 Unpatterned Wafer Surface Defect Tool
|
1
|
|
|
|
|
 |
250815
|
KLA-Tencor
|
KLA-Tencor |
Surfscan SP1 |
in Surface Inspection
KLA-TENCOR Surfscan SP1 Unpatterned Wafer Surface Defect Too:KLA-TENCOR Surfscan SP1 Unpatterned Wafer Surface Defect Tool
|
1
|
|
|
|
|
 |
250816
|
KLA-Tencor
|
KLA-Tencor |
Surfscan SP3+ |
in Surface Inspection
KLA-TENCOR Surfscan SP3+ Unpatterned Surface Defect Tool:KLA-TENCOR Surfscan SP3+ Unpatterned Wafer Surface Defect Tool - DUV Illumination
- Particle Detection to 32nm
- Dual 300mm FOUP Loadports
- Please Inquire for Additional Details
|
1
|
|
|
|
|
 |
249588
|
Nikon
|
Nikon |
Labophot 2 |
in Optical Microscopes
|
1
|
|
|
|
|
 |
251440
|
Nikon
|
Nikon |
NWL-641 |
in Parts and Accessories, Microscope
Nikon NWL-641 Microscope Automatic Wafer Loader:Nikon NWL-641 Microscope Automatic Wafer Loaders, 2ea Available
|
2
|
|
|
 |
|
 |
251439
|
Nikon
|
Nikon |
NWL200T |
in Parts and Accessories, Microscope
Nikon NWL200T Microscope Wafer Loader:Nikon NWL200T Microscope Automatic Wafer Loader
|
1
|
|
|
|
|
 |
155646
|
Nikon
|
Nikon |
Optiphot 200 |
in Optical Microscopes
Nikon Optiphot 200:NIKON Optiphot 200 Wafer Inspection Stand, Including - Focus Mechanism
- Interference Contrast Polarizer/Analyzer
|
1
|
|
|
|
|
 |
120404
|
Nikon
|
Nikon |
Optiphot 88 |
in Optical Microscopes
Nikon Optiphot 88:NIKON Optiphot-88 Wafer Inspection Microscope - 5 Position Turret with Motorized Rotation
- BDPlan 5X, 10X, 20X, 40X & 100X Bright/Darkfield Objective Lenses
- Trinocular Viewing Head with 10X Widefield Eyepieces
- C-Mount with Television Lens Included
- Vertical Illuminator with 12V/50W Halogen Lamp Housing
- Brightfield & Darkfield Channels
- Dual Iris Apertures
Specimen Stage with 200mm X 200mm XY Travel
|
1
|
|
|
|
|
 |
179537
|
Nikon
|
Nikon |
Optiphot-150S |
in Optical Microscopes
Nikon Optiphot-150S Wafer Inspection Microscope:Nikon Optiphot-150S Wafer Inspection Microscope - 2.5X, 5X, 10X, 20X & 50X CF Plan Bright/Darkfield Objective Lenses
- Binocular Head with CFWN 10X/20 WF Eyepieces
- Wafer Stage for Use with Nikon NWL-641 Wafer Loader
- 12V/50W Lamphouse with Internal Illumination Transformer
- Nikon NWL-641M Wafer Loader & Wafer Transfer XYO Stage
- Macro Inspection Capability
- Also Available with Bright/Darkfield Objective Lenses
- Also Available with Ergo Trinocular Head and Color Camera
- Also Available without NWL-641 Wafer Loader
|
1
|
|
|
 |
|
 |
212138
|
Nikon
|
Nikon |
Optiphot-150S |
in Optical Microscopes
Nikon Optiphot-150S Wafer Inspection Microscope:Nikon Optiphot-150S Wafer Inspection Microscope - 5X 10X, 20X, 50X & 100X CF Plan Brightfield EPI Objective Lenses
- Ergo Trinocular Head with CFWN 10X/20 WF Eyepieces
- Color CMOS Microscope Camera
- Wafer Stage for Use with Nikon NWL Wafer Loader
- 12V/50W Lamphouse with Internal Illumination Transformer
- Nikon NWL-641M Wafer Loader & Wafer Transfer XYO Stage
- Macro Inspection Capability
- Also Available with Bright/Darkfield Objective Lenses
- Also Available without NWL-641 Wafer Loader
|
1
|
|
|
 |
|
 |
124185
|
Nikon
|
Nikon |
Optistation 3 |
in Microscope Inspection Tools
Nikon Optistation 3:Wafer Inspection Tool for 6" Wafers
|
1
|
|
|
 |
|
 |
87091
|
Nikon
|
Nikon |
Optistation 3A |
in Microscope Inspection Tools
Nikon Optistation 3A:Automatic Wafer Inspection Station
|
1
|
|
|
 |
|
 |
61043
|
Nikon
|
Nikon |
Optiphot |
in Optical Microscopes
Nikon/Semprex Measuring Microscope: NIKON/SEMPREX Wafer Measuring Microscope - 4 Position Turret
- NIKON MPlan 2.5X, BDPlan 10X, 20X & 40X Objective Lenses
- NIKON Binocular Viewing Head with 10X Widefield Eyepieces
- NIKON Vertical Illuminator with 12V/50W Halogen Lamp Housing
- Brightfield & Darkfield Channels
- Dual Iris Apertures
- NIKON Model UN Illumination Transformer
- SEMPREX Microscope Stand
- Specimen Stage 6” X 6.75”
- 2ea Mitutoyo 164-136 Digital Micrometers for XY Measurement
- 0-2” in X Axis & 0-1.5” in Y Axis; Resolution to 0.0001”
- Mitutoyo 534-223-1 Digital Micrometer for Height Measurement
- 0-1” in Z Axis; Resolution to 0.0001”
|
1
|
|
|
F* |
|
 |
160214
|
Olympus
|
Olympus |
BH-BHM |
in Optical Microscopes
Olympus BH-BHM Microscope:Wafer Inspection Microscope
|
1
|
|
|
F* |
|
 |
248944
|
Olympus
|
Olympus |
MX50 |
in Optical Microscopes
Olympus MX50 Wafer Inspection Microscope:OLYMPUS MX50A-F Reflected Light Microscope - Five Position Motorized Turret with the Following Objective Lenses:
- OLYMPUS MPlanFl N 5X/0.15 BD
- OLYMPUS UMPlanFl 10X/0.30 BD
- OLYMPUS LMPlanFl 20X/0.40 BD
- OLYMPUS LMPlanFl 50X /0.50 BD
- OLYMPUS Trinocular Head with 2ea OLYMPUS WH10X Eyepieces
- OLYMPUS DBX Extension Tube with DIAGNOSTIC INST. 1.0X C Mount Adapter
- PIXELINK PL-B777U Solid State Camera
- Specimen Stage with 150mm X 150mm XY Travel
- OLYMPUS MX-LSH Lamp House with 12V 100W Halogen Lamp
- 100/115VAC 50/60Hz Input Voltage
|
1
|
|
|
 |
|
 |
252331
|
Olympus
|
Olympus |
MX80AF-F |
in Optical Microscopes
Olympus MX80AF-F Wafer Inspection Microscope:Olympus MX80AF-F Wafer Inspection Microscope - Autofocus Capability
- Ludl Motorized Stage for up to 300mm Wafers
- Bright/Darkfield Optics:
- Motorized Turret with 6ea Objective Lenses:
- 5X, 10X, 20X, 50X & 100X UMPlanFl BD P
- 150X LMPlan Apo BD
- Interference Contrast Optical System
- Trinocular Viewing Head with Color CCD Camera & Monitor
|
1
|
|
|
 |
|
 |
120405
|
Olympus
|
Olympus |
SZ3060 |
in Optical Microscopes
Olympus SZ3060:StereoZoom Microscope
|
1
|
|
|
F* |
|
 |
120406
|
Olympus
|
Olympus |
SZ3060 |
in Optical Microscopes
Olympus SZ3060:StereoZoom Microscope
|
1
|
|
|
F* |
|
 |
50017
|
KLA-Tencor
|
KLA-Tencor |
Surfscan 4500 |
in Surface Inspection
Tencor Surfscan 4500:TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool - Cassette to Cassette Handling of 3” – 6” Wafers
- New HeNe 2mW Laser, 632.8 nm Wavelength
- New HeNe Laser Power Supply
- 2 µ Particle Size Sensitivity
- Automatic Calibration
- Flatscreen Monitor
- System Calibrated & Demonstrated
- Calibration Standard Wafer Included
|
1
|
|
45,000.00 |
 |
|
 |
249591
|
Tencor
|
Tencor |
Surfscan 5500 |
in Surface Inspection
Tencor Surfscan 5500 Unpatterned Wafer Surface Inspection Tool:Tencor Surfscan 5500 Unpatterned Wafer Surface Inspection Tool
|
1
|
|
|
|
|
 |
23995
|
Vision Engineering
|
Vision Engineering |
Dynascope |
in Optical Microscopes
Vision Engineering - Dynascope:Projection Microscope
|
1
|
|
|
 |
|