 |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Make |
Model |
|
|
$ |
|
 |
254018
|
KLA-Tencor
|
KLA-Tencor |
2138XP |
in Microscope Inspection Tools
KLA-Tencor 2138XP Brightfield Inspection Tool:KLA-Tencor 2138XP Brightfield Defect Inspection Tool - 0.25µ, 0.39µ, 0.62µ Spot Sizes
- For 150mm & 200mm Wafers
- Model 2552UI User Interface
- Denkenseiki Noise Filter
- Please Inquire for Additional Details
|
1
|
|
|
 |
|
 |
129073
|
KLA-Tencor
|
KLA-Tencor |
760-660139-00 |
in Motors
KLA-Tencor Power Changing Assy 760-660139-00:3 Lens Power Changing Assy complete w/optics
|
1
|
|
|
 |
|
 |
250822
|
KLA-Tencor
|
KLA-Tencor |
SWE Kit |
in Film Thickness Testers
KLA-TENCOR Spectra fx SWE Kit:KLA-TENCOR Spectra fx Single Wave Ellipsometer Kit
|
1
|
|
|
|
|
 |
254093
|
KLA-Tencor
|
KLA-Tencor |
Aleris 8350 |
in Film Thickness Testers
KLA-TENCOR Aleris 8350 Advanced Film Metrology Tool:KLA-TENCOR Aleris 8350 Advanced Film Metrology Tool - Dual 300 mm Loadports
- Wafer Level Reliability
- Broadband Spectroscopic Ellipsometer
- Single Wave Ellipsometer
- Stress Measurement
- iDesorber
|
1
|
|
|
 |
|
 |
250811
|
KLA-Tencor
|
KLA-Tencor |
Aleris 8350 |
in Film Thickness Testers
KLA-TENCOR Aleris 8350 Film Metrology Tool:KLA-TENCOR Aleris 8350 Advanced Film Metrology Tool - Dual 300 mm Loadports
- Wafer Level Reliability
- Broadband Spectroscopic Ellipsometer
- Single Wave Ellipsometer
- Stress Measurement
- iDesorber
|
1
|
|
|
 |
|
 |
249589
|
KLA-Tencor
|
KLA-Tencor |
ASET-F5x |
in Film Thickness Testers
KLA-Tencor ASET-F5x Thin Film Measurement System:KLA-TENCOR ASET-F5x Thin Film Measurement System - Serial Number 0202802R
- Manufactured in June, 2002
- Inspection Modes Include:
- Dual Beam Spectrometry
- Spectroscopic Ellipsometry
- Film Stress Analysis
- SUMMIT™ Application Software Version 3.21.16
- FTML Version 3.46.06
- Model 300DFF1P Wafer Loading Platform
- Dual Loadports for 300mm Wafers
- Three Axis Wafer Handling Robot
- GEM / SECS Communication
- Inquire for Additional Details
|
2
|
|
|
 |
|
 |
247843
|
KLA-Tencor
|
KLA-Tencor |
UV-1050 |
in Film Thickness Testers
KLA-Tencor UV-1050 Thin Film Measurement Tool:KLA-Tencor UV-1050 Thin Film Measurement Tool - Cassette to Cassette Wafer Handling
- Wafer sizes: 100mm, 150mm & 200mm
- Broadband UV Optics
- Dual Beam Spectrophotometry
- Applications: Polysilicon, UV Reflectivity & Simultaneous Oxide and TiN Thickness for CMP
- System Control PC with Windows NT OS
- Summit Application Software
- GEM / SECS Communication
- System Installation at Destination Available
|
1
|
|
55,000.00 |
|
|
 |
133789
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
740-212542-000 |
in Lamps
KLA-Tencor 740-212542-000 Insert Assy with Lamps:KLA-Tencor 740-212542-000 Insert Assy with LampsInsert Assy with Lamps
|
1
|
|
|
 |
|
 |
254098
|
KLA
|
KLA |
Altair 8935-FFC |
in Metrology Equipment
KLA Altair 8935-FFC AOI Tool:KLA Altair 8935-FFC AOI Tool - For 200mm Patterned Wafers on Film Frames
- Brightfield/Darkfield Optics
- 2X, 5X, 10X & 20X Objectives
- 35X LWD Review Capability
- 0.2 um Max DF Sensitivity
- Die to Die Detection Algorithm
- Focus Freeze (High Topo) ADAR
- Deep Learning ADC
- 4 WPH Throughput
|
1
|
|
|
 |
|
 |
254099
|
KLA
|
KLA |
Altair 8920i |
in Metrology Equipment
KLA Altair 8920i AOI Tool:KLA Altair 8920i AOI Tool - For 200mm & 300mm Patterned & Unpatterned Wafers
- Brightfield/Darkfield Optics
- 2X, 3.5X, 5X & 10X Objectives
- 35X Review Capability
- 0.4 um Max DF Sensitivity
- Die to Die Detection Algorithm
- Focus Tracking
- RBB Defect Classification
- 18 WPH Throughput
|
1
|
|
|
 |
|
 |
254100
|
KLA
|
KLA |
Altair 8935i |
in Metrology Equipment
KLA Altair 8935i AOI Tool:KLA Altair 8935i AOI Tool - For 150mm & 200mm Patterned & Unpatterned Wafers
- For GaN & GaAs on Sapphire & Silicon Wafers
- Brightfield/Darkfield Optics
- 2X, 5X, 10X & 20X Objectives
- 35X LWD Review Capability
- 0.2 um Max DF Sensitivity
- Die to Die Detection Algorithm
- Focus Tracking
- RBB Defect Classification
- 6.5 WPH Throughput
|
1
|
|
|
 |
|
 |
250823
|
KLA-Tencor
|
KLA-Tencor |
Viper 2401 |
in Metrology Equipment
KLA-TENCOR Viper 2401 After Develop Inspection Tool:KLA-TENCOR Viper 2401 After Develop Inspection Tool - Please Inquire for Details
|
1
|
|
|
|
|
 |
252332
|
KLA Tencor
|
KLA Tencor |
DSW16E |
in Metrology Equipment
KLA-Tencor DSW16E 300mm Calibration Wafer:KLA-Tencor DSW16E 300mm Calibration Wafer - Part Number 0210691-000 (Advanced Technology Development)
- For Use on e-Beam Patterned Wafer Defect Inspection Tools
|
1
|
|
|
 |
|
 |
250821
|
KLA-Tencor
|
KLA-Tencor |
Archer 200 AIM |
in Critical Dimension Measurement Equipment
KLA-TENCOR Archer 200 AIM Overlay Metrology Tool:KLA-TENCOR Archer 200 AIM Overlay Metrology Tool - ETAL Stage
- Yaskawa Robot with NXC100 Controller
- IDE Maxon 1000 Floatation Controller
|
1
|
|
|
 |
|
 |
218321
|
KLA-Tencor
|
KLA-Tencor |
AIT |
in Surface Inspection
KLA-Tencor AIT Patterned Wafer Inspection Tool:KLA-Tencor AIT Patterned Wafer Inspection Tool
|
1
|
|
|
|
|
 |
149499
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
710-658164-20 |
in Electrical and Electronic Components
KLA Tencor 710-658164-20 PLLAD-8 Assy:KLA Tencor 710-658164-20 PLLAD-8 AssyPLLAD-8 Assy
|
1
|
|
|
 |
|
 |
149500
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
710-653016-20 |
in Electrical and Electronic Components
KLA Tencor 710-653016-20 81B Assy:KLA Tencor 710-653016-20 81B Assy81B Assy
|
1
|
|
|
 |
|
 |
149501
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
710-658076-20 |
in Electrical and Electronic Components
KLA Tencor 710-658076-20 Phase 3 Defect Processor PCB:KLA Tencor 710-658076-20 Phase 3 Defect Processor PCBPhase 3 Defect Processor PCB
|
1
|
|
|
 |
|
 |
149503
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
710-658081-20 |
in Electrical and Electronic Components
KLA Tencor 710-658081-20 Defect Filter PCB Assy:KLA Tencor 710-658081-20 Defect Filter PCB AssyDefect Filter PCB Assy
|
1
|
|
|
 |
|
 |
95391
|
KLA
|
KLA |
710-651090-20 |
in Electrical and Electronic Components
KLA:Optics Interface PC BoardOptics Interface PC Board
|
1
|
|
|
 |
|
 |
104306
|
KLA-Tencor
|
KLA-Tencor |
AlphaStep 300 |
in Film Thickness Testers
KLA-Tencor AlphaStep 300 Profilometer:Profilometer
|
1
|
|
|
 |
|
 |
250812
|
KLA-Tencor
|
KLA-Tencor |
HRP-240 |
in Film Thickness Testers
KLA-TENCOR HRP-240 High Resolution Profiler:KLA-TENCOR HRP-240 High Resolution Profiler - Cassette to Cassette Wafer Handling for up to 200mm Wafers
- Previously Configured for SMIF Wafer Handling
- Please Inquire for Additional Details
|
1
|
|
|
 |
|
 |
252475
|
KLA -Tencor OEM*
|
KLA -Tencor OEM* |
|
in Semiconductor Parts
KLA-Tencor 6XX0 Ceramic End Effector - New:Ceramic End Effector for Surfscan 6XX0 Tools
|
1
|
|
|
 |
|
 |
252477
|
KLA -Tencor OEM*
|
KLA -Tencor OEM* |
52-0027 |
in Semiconductor Parts
KLA-Tencor ART Power Supply Module:KLA-Tencor ART Power Supply Module - 3ea Available
- 1ea Refurbished
|
1
|
|
|
|
|
 |
252478
|
KLA -Tencor OEM*
|
KLA -Tencor OEM* |
51-0175, Rev. D |
in Semiconductor Parts
KLA-Tencor 51-0175, Rev. D H2 Wafer Handler Prealigner:KLA-Tencor 51-0175, Rev. D H2 Wafer Handler Prealigner
|
1
|
|
|
 |
|
 |
252479
|
KLA -Tencor OEM*
|
KLA -Tencor OEM* |
52-0466, Rev. F |
in Semiconductor Parts
KLA-Tencor 52-0466 DBS Spectrometer Lid :KLA-Tencor 52-0466 DBS Spectrometer Lid
|
1
|
|
|
 |
|
 |
131811
|
KLA Mfr*
|
KLA Mfr* |
760-661136-00 |
in Semiconductor Parts
KLA Insulated Vertical Illuminator 760-661136-00:KLA Insulated Vertical Illuminator 760-661136-00Insulated Vertical Illuminator
|
1
|
|
|
 |
|
 |
132079
|
KLA Mfr*
|
KLA Mfr* |
710-657058-20 |
in Semiconductor Parts
KLA 710-657058-20 Auto Focus Led Driver:KLA 710-657058-20 Auto Focus Led DriverAuto Focus Led Driver
|
1
|
|
|
 |
|
 |
95390
|
KLA
|
KLA |
710-659227-00 |
in Semiconductor Parts
KLA Instruments:Wafer Inspection BackplaneWafer Inspection Backplane
|
1
|
|
|
 |
|
 |
155840
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
410918 |
in Semiconductor Parts
KLA-Tencor PN 410918:L-Stylus, DurasharpL-Stylus, Durasharp
|
5
|
|
|
|
|
 |
252551
|
KLA -Tencor
|
KLA -Tencor |
Surfscan 6420 |
in ALL CATEGORIES
KLA-TENCOR Surfscan 6420 Unpatterned Wafer Surface Contamination Tool:KLA-TENCOR Surfscan 6420 Unpatterned Wafer Surface Contamination Tool - Please Inquire for Additional Details
|
1
|
|
|
|
|
 |
252552
|
KLA -Tencor
|
KLA -Tencor |
Auto RS-75tc |
in ALL CATEGORIES
KLA-TENCOR Auto RS-75tc Resistivity Mapping Tool:KLA-TENCOR Auto RS-75tc Resistivity Mapping Tool Please Inquire for Details
|
1
|
|
|
|
|
 |
249590
|
KLA-Tencor
|
KLA-Tencor |
Flexus 5400 |
in Metrology Equipment
KLA-Tencor Flexus 5400 Stress Measurement Tool:KLA-Tencor Flexus 5400 Stress Measurement Tool - Model # 304514
- Cassette to Cassette Handling of 100mm - 200mm Wafers
- Please Inquire for Additional Details
|
1
|
|
|
 |
|
 |
250814
|
KLA-Tencor
|
KLA-Tencor |
Surfscan SP1 |
in Surface Inspection
KLA-Tencor Surfscan SP1 Unpatterned Surface Defect Tool:KLA-Tencor Surfscan SP1 Unpatterned Wafer Surface Defect Tool
|
1
|
|
|
|
|
 |
250815
|
KLA-Tencor
|
KLA-Tencor |
Surfscan SP1 |
in Surface Inspection
KLA-TENCOR Surfscan SP1 Unpatterned Wafer Surface Defect Too:KLA-TENCOR Surfscan SP1 Unpatterned Wafer Surface Defect Tool
|
1
|
|
|
|
|
 |
250816
|
KLA-Tencor
|
KLA-Tencor |
Surfscan SP3+ |
in Surface Inspection
KLA-TENCOR Surfscan SP3+ Unpatterned Surface Defect Tool:KLA-TENCOR Surfscan SP3+ Unpatterned Wafer Surface Defect Tool - DUV Illumination
- Particle Detection to 32nm
- Dual 300mm FOUP Loadports
- Please Inquire for Additional Details
|
1
|
|
|
|
|
 |
250818
|
KLA-Tencor
|
KLA-Tencor |
Puma 9120 IS |
in Surface Inspection
KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool:KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool - For 200mm or 300mm Wafers
- 2ea Cameras
- Please Inquire for Additional Details
|
1
|
|
|
 |
|
 |
250819
|
KLA-Tencor
|
KLA-Tencor |
Puma 9130 |
in Surface Inspection
KLA-TENCOR Puma 9130 Darkfield Inspection Tool:KLA-TENCOR Puma 9130 Darkfield Inspection Tool - Parts Tool
- Please Inquire for Additional Details
|
1
|
|
|
|
|
 |
50017
|
KLA-Tencor
|
KLA-Tencor |
Surfscan 4500 |
in Surface Inspection
Tencor Surfscan 4500:TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool - Cassette to Cassette Handling of 3” – 6” Wafers
- New HeNe 2mW Laser, 632.8 nm Wavelength
- New HeNe Laser Power Supply
- 2 µ Particle Size Sensitivity
- Automatic Calibration
- Flatscreen Monitor
- System Calibrated & Demonstrated
- Calibration Standard Wafer Included
|
1
|
|
45,000.00 |
 |
|
 |
126787
|
KLA-Tencor
|
KLA-Tencor |
|
in Production Equipment
KLA-Tencor SQ. 4" Wafer Locator Ring for Flexus 2320:SQ. 4" Wafer Locator Ring for Flexus 2320
|
1
|
|
|
 |
|
 |
126788
|
KLA-Tencor
|
KLA-Tencor |
|
in Production Equipment
KLA-Tencor 3" Wafer Locator Rings for Flexus 2320:3" Wafer Locator Rings for Flexus 2320
|
2
|
|
|
 |
|