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Metrology Equipment


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List all 58 product types under Metrology EquipmentList all 58 product types under Metrology Equipment


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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes
Make Model
  $  
110263
ADE  

ADE  

Episcan 1000 

List all items of this typeFT-IR Spectrometers

in Spectrometers

ADE Episcan 1000:

ADE Episcan 1000 Film Thickness Measurement & Mapping Tool

  • Measurement of Epi Films <25µ
  • ON-LINE TECHNOLOGIES 2110 Spectrometer Head
  • IRVINE OPTICAL Nanoloader II Dual Cassette Wafer Handler
  • ADE ACS Controller
  • Windows NT Operating System
  • Price.............................................................................$75,000.00
  • As-Is Price....................................................................$40,000.00
1   F*
159266
Bausch & Lomb  

Bausch & Lomb  

SZ4 

List all items of this typeStereo Microscopes

in Optical Microscopes

Bausch & Lomb Stereo Zoom 4:
StereoZoom 4 Microscope with Boom Stand
1   F*
161016
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 4 

List all items of this typeStereo Microscopes

in Optical Microscopes

Bausch & Lomb StereoZoom 4:
Microscope on Small Base
1  
161018
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 6 Plus 

List all items of this typeStereo Microscopes

in Optical Microscopes

Bausch & Lomb StereoZoom 6 Plus:
Microscope Head
1   F*
159267
Bausch & Lomb  

Bausch & Lomb  

SZ 6-ST 

List all items of this typeStereo Microscopes

in Optical Microscopes

Bausch & Lomb StereoZoom 6-ST:
StereoZoom Microscope with Boom Stand
1  
157435
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 7 

List all items of this typeStereo Microscopes

in Optical Microscopes

BAUSCH & LOMB StereoZoom 7:
Microscope & Boom Stand
1   F*
231442
Bio-Rad Q7 Overlay Metrology Tool 
Bio-Rad Q7 Overlay Metrology Tool 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

Bio-Rad Q7 Overlay Metrology Tool:

Bio-Rad Q7 Overlay Metrology Tool

1  
219230
Bio-Rad  

Bio-Rad  

Q8 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

Bio-Rad Q8 Overlay Metrology Tool:

Bio-Rad Q8 Overlay Metrology Tool

1  
225795
Bio-Rad  

Bio-Rad  

QS-1200 

List all items of this typeFT-IR Spectrometers

in Spectrometers

Bio-Rad QS-1200 FT-IR Spectrometer:

BIORAD QS-1200 Automated FT-IR Spectrometer

  • Non-Destructive Measurement of Epitaxial Silicon Films
  • PIKE TECHNOLOGIES MAP300 Automatic Scanning Stage
    • Manual Loading for up to 300mm Wafers
    • 320 Test Points, 5mm Minimum Edge Exclusion & 3D Wafer Mapping
  • FTS-175 Optical Bench
    • Dynamically Tuned Beam Splitter
    • NKBr Beam Splitter
    • Dual Frequency IR Source
    • Upgraded HeNe Laser
  • System Control PC with Windows XP, 320G HD & 1G RAM
    • Win-IR Pro (Rev. 2.51) Application Software
    • QS-500 Epi (Rev. 1.31) Application Software
    • Microsoft Access Database Application
  • System Software, Applications Software & Site Preparation Manuals Included
  • Refurbished & Fully Functional
1 110,000.00
121504
Bio-Rad  

Bio-Rad  

Q5 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

Biorad Q5:
Overlay Registration Tool
2  
31390
Bio-Rad  

Bio-Rad  

Q5 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

BioRad Q5:
Overlay Registration Tool - Has Been Upgraded to a Q6

CD Measurement, Single and Two-Axis Overlay Registration
1   F*
54652
Bio-Rad  

Bio-Rad  

Q7/Q8 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

BioRad Q7/Q8 Overlay Metrology Tool:
Overlay Metrology Tool for up to 200mm Wafers
1   F*
144802
CR Technology  

CR Technology  

UF160/0 

List all items of this typeXray Fluorescence Spectrometers

in Spectrometers

CR Technology XRay System UF160/0:
XRAY Wafer Analyzer
1  
194899
DELTRONIC  

DELTRONIC  

DH14-RR 

List all items of this typeMeasuring Microscopes

in Optical Microscopes

Deltronic DH14-RR Profile Projector :
Deltronic DH14-RR Profile Projector 
  • 20X Objective Lens
1  
159268
Diagnostic Instrumts  

Diagnostic Instrumts  

 

List all items of this typeStereo Microscopes

in Optical Microscopes

Diagnostic Instruments:
Microscope Boom Stand
2  
238938
Four Dimensions  

Four Dimensions  

CV92A 

List all items of this typeCV Plotters

in Metrology Equipment

Four Dimensions CV92A Semiautomatic CV Plotter:

Four Dimensions CV92A Semiautomatic CV Plotter

  • Mercury Probe
  • System Control Computer
  • Embedded Computer
1 50,000.00
49926
GCA/Tropel  

GCA/Tropel  

9000 

List all items of this typeUnpatterned Wafer Inspection

in Surface Inspection

GCA/TROPEL 9000:
Surface Flatness Analyzer
1  
35762
Hitachi  

Hitachi  

S-7000 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Critical Dimension Measurement Equipment

Hitachi S-7000:
CD SEM Measurement Tool
1   F*
218321
KLA-Tencor  

KLA-Tencor  

AIT 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

KLA-Tencor AIT Patterned Wafer Inspection Tool:

KLA-Tencor AIT Patterned Wafer Inspection Tool

  • Call for Details
1  
104306
KLA-Tencor  

KLA-Tencor  

AlphaStep 300 

List all items of this typeProfilometers

in Film Thickness Testers

KLA-Tencor AlphaStep 300 Profilometer:
Profilometer
1  
247845
KLA-Tencor  

KLA-Tencor  

Auto RS-55tc 

List all items of this type4 & 6 Point Probes

in Resistivity Testers

KLA-Tencor Auto RS-55tc Resistivity Test Tool:

KLA-TENCOR Auto RS-55tc Resistivity Mapping System

  • Accommodates all Wafer Sizes from 50mm – 200mm
  • 5 Megaohm/sq Measurement Range
  • Typical Measurement Time: 5 – 4.5 Seconds per Test Site
  • <0.2% (1 sigma) Measurement Repeatability
  • Thermal Chuck Temperature Measurement Accuracy: ±0.5ºC
  • PC Based System Controller
  • 25 MHz 486 Based MPU
  • 44 MB Removable Hard Disk
  • 110 MB Fixed Hard Disk Drive
  • 5” Floppy Disk Drive
  • X-Y Map: Up to 1200 Sites Programmable
  • Probe Qualification: 20 sites
  • 1 - 30 Programmable Routine Test Sites (ASTM Standard Tests Included)
1 80,000.00 N*
247844
KLA-Tencor  

KLA-Tencor  

RS-55tc 

List all items of this type4 & 6 Point Probes

in Resistivity Testers

KLA-Tencor RS-55tc Resistivity Test Tool:

KLA-Tencor RS-55tc Resistivity Test Tool

  • Accommodates all Wafer Sizes from 50mm – 200mm
  • Sheet Resistance Measurement of 5 mohm/sq to 5 Mohm/sq
  • Typical Measurement Time: 5 – 4.5 Seconds per Test Site
  • <0.2% (1 sigma) Measurement Repeatability
  • X-Y Map: Programmable Up to 1200 Sites
  • Probe Qualification: 20 sites
  • 1 - 30 Programmable Routine Test Sites (ASTM Standard Tests Included)
  • PC Based System Controller with Color Monitor
1 35,000.00 N*
247843
KLA-Tencor  

KLA-Tencor  

UV-1050 

List all items of this typeFilm Thickness Testers - Other

in Film Thickness Testers

KLA-Tencor UV-1050 Thin Film Measurement Tool:

KLA-Tencor UV-1050 Thin Film Measurement Tool

  • Cassette to Cassette Wafer Handling
  • Wafer sizes: 100mm, 150mm & 200mm
  • Broadband UV Optics
  • Dual Beam Spectrophotometry
  • Applications: Polysilicon, UV Reflectivity & Simultaneous Oxide and TiN Thickness for CMP
  • System Control PC with Windows NT OS
  • Summit Application Software
  • GEM / SECS Communication
  • System Installation at Destination Included
1 55,000.00 N*
159451
Nicolet  

Nicolet  

Magna-IR 550 

List all items of this typeFT-IR Spectrometers

in Spectrometers

NICOLET Magna-IR 550:
FT-IR Spectrometer
1   F*
212138
Nikon  

Nikon  

Optiphot 150 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

Nikon Optiphot 150 Wafer Inspection Microscope:

Nikon Optiphot 150 Wafer Inspection Microscope

  • Motorized Turret Rotation
  • 10X, 20X, 50X & 100X CF Plan BF/DF Objective Lenses
  • DIC Filter Slots on Turret (Polarizer & Analyzer Not Included) 
  • Binocular Head with 10X WF Eyepieces
  • Wafer Stage for Use with Nikon NWL Wafer Loader
  • 12V/50W Lamphouse with Internal Illumination Transformer
1  
179537
Nikon  

Nikon  

Optiphot 150 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

Nikon Optiphot 150 Wafer Inspection Microscope:
Nikon Optiphot 150 Wafer Inspection Microscope 
1  
155646
Nikon  

Nikon  

Optiphot 200 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

Nikon Optiphot 200:

NIKON Optiphot 200 Wafer Inspection Stand, Including

  • Focus Mechanism
  • Interference Contrast Polarizer/Analyzer
1  
217690
Nikon  

Nikon  

Optiphot 200 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

Nikon Optiphot 200 Wafer Inspection Microscope:

 Nikon Optiphot 200 Wafer Inspection Microscope

  • Bright/Darkfield with Interference Contrast  
  • Prior Proscan Stage with Joystick & 200mm X 200mm XY Travel
  • Motorized Turret with 5ea Objective Lenses 
  • NMH-1 Illumination Source
1  
241416
Nikon  

Nikon  

Optiphot 200/NWL 860 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

Nikon Optiphot 200 Wafer Inspection Microscope with NWL 860 Wafer Loader:

Nikon Optiphot 200 Wafer Inspection Microscope with NWL 860 Wafer Loader

  • Bright/Darkfield Objective Lenses
    • CF Plan 2.5X, 5X, 10X, 20X & 50X 
  • Nikon NWL 860 Automatic Wafer Loader
  • Ergonomic Trinocular Viewing Head with CFUWN10X/25 Eyepieces & 1X/16 TV Relay Lens
1  
120404
Nikon  

Nikon  

Optiphot 88 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

Nikon Optiphot 88:

NIKON Optiphot-88 Wafer Inspection Microscope  

  • 5 Position Turret with Motorized Rotation
  • BDPlan 5X, 10X, 20X, 40X & 100X Bright/Darkfield Objective Lenses
  • Trinocular Viewing Head with 10X Widefield Eyepieces
  • C-Mount with Television Lens Included
  • Vertical Illuminator with 12V/50W Halogen Lamp Housing
  • Brightfield & Darkfield Channels
  • Dual Iris Apertures

Specimen Stage with 200mm X 200mm XY Travel

1  
124185
Nikon  

Nikon  

Optistation 3 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

Nikon Optistation 3:
Wafer Inspection Tool for 6" Wafers
1  
131378
Nikon  

Nikon  

Optistation 3 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

Nikon Optistation 3:
Wafer Inspection Tool for 6" Wafers
1  
86230
Nikon  

Nikon  

Optistation 3 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

Nikon Optistation 3:
Automatic Wafer Inspection Station
1  
87091
Nikon  

Nikon  

Optistation 3A 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

Nikon Optistation 3A:
Automatic Wafer Inspection Station
1  
245327
Nikon  

Nikon  

Ti2-E 

List all items of this typeInverted Microscopes

in Optical Microscopes

Nikon Ti2-E Inverted Microscope:

Nikon Ti2-E Inverted MicroscopeTi2-E

  • Binocular Viewing Head with 2ea CFI 10X Eyepieces
  • Nikon Ti2-N-ND-E Motorized DIC Sextuple Nosepiece, Including:
    • Nikon Plan Fluor 10X Objective lens
    • Nikon S Plan Fluor 40X ELWD Objective lens
    • Nikon Plan APO 100X Objective lens
  • Nikon Ti2-F-FLT-E Motorized Epi-Fluorescence Filter Cube Turret
  • Nikon Ti2-LA-FL Epi-Fluorescence Illuminator Module
  • Nikon TC-S-SR Specimen Stage with C-S-HU Universal Holder
  • Nikon Ti2-CTRE Microscope Controller
  • Hamamatsu C11440-42U30 ORCA-Flash4.0LT+ CMOS Camera
  • Lumencor Sola SE 5-LCR-VB Light Engine with Light Engine Control
1  
135595
Nikon  

Nikon  

V-12 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

Nikon V-12 Profile Projector:
Profile Projector

Optical Comparator
1  
61043
Nikon  

Nikon  

Optiphot 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

Nikon/Semprex Measuring Microscope:

 NIKON/SEMPREX Wafer Measuring Microscope

  • 4 Position Turret
  • NIKON MPlan 2.5X, BDPlan 10X, 20X & 40X Objective Lenses
  • NIKON Binocular Viewing Head with 10X Widefield Eyepieces
  • NIKON Vertical Illuminator with 12V/50W Halogen Lamp Housing
    • Brightfield & Darkfield Channels
    • Dual Iris Apertures
  • NIKON Model UN Illumination Transformer
  • SEMPREX Microscope Stand
    • Specimen Stage 6” X 6.75”
      • 2ea Mitutoyo 164-136 Digital Micrometers for XY Measurement
      • 0-2” in X Axis & 0-1.5” in Y Axis; Resolution to 0.0001”
      • Mitutoyo 534-223-1 Digital Micrometer for Height Measurement
      • 0-1” in Z Axis; Resolution to 0.0001”
1   F*
160214
Olympus  

Olympus  

BH-BHM 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

Olympus BH-BHM Microscope:
Wafer Inspection Microscope
1   F*
120405
Olympus  

Olympus  

SZ3060 

List all items of this typeStereo Microscopes

in Optical Microscopes

Olympus SZ3060:
StereoZoom Microscope
1   F*
120406
Olympus  

Olympus  

SZ3060 

List all items of this typeStereo Microscopes

in Optical Microscopes

Olympus SZ3060:
StereoZoom Microscope
1   F*
172746
Plasmos  

Plasmos  

SD 2004 

List all items of this typeEllipsometers

in Film Thickness Testers

Plasmos SD-2004 Multi-Wavelength Ellipsometer:
Plasmos SD-2004 Multi-Wavelength Ellipsometer
1  
179535
Plasmos  

Plasmos  

SD2000 

List all items of this typeEllipsometers

in Film Thickness Testers

1  
50006
Sagax  

Sagax  

Isoscope 125 

List all items of this typeEllipsometers

in Film Thickness Testers

Sagax Isoscope 125:
Ellipsometer
1  
241435
Sloan  

Sloan  

Dektak 3ST Auto 1 

List all items of this typeProfilometers

in Film Thickness Testers

Sloan Dektak3ST Surface Profile Measuring System:

Sloan Dektak3ST Auto 1 Surface Profile Measuring System

  • For Step Height & Surface Texture Measurement
  • Self-Contained, Small Footprint Design
  • Joystick Controlled Scanning Stage 
  • 8000 Data Points
  • Specimen Stage: 6.5”(dia.); 6”X Axis X 3”Y Axis Travel; 360° θ
  • Maximum Sample Thickness: 1.5”
  • Measurement Display Range: 100Å to 1,310KÅ
  • Vertical Resolution: 1Å/65KÅ; 10Å/655KÅ; 20Å/1310KÅ
  • Stylus Force Range: 1mg to 40mg
  • Scan Length Range: 50m to 50mm
  • Scan Time Range: 3 to 50 Seconds
  • Video Zoom Range: 60X to 420X (Motorized)
1  
179531
Solid State Measrmnt  

Solid State Measrmnt  

470i 

List all items of this typeCV Plotters

in Metrology Equipment

1  
50017
KLA-Tencor  

KLA-Tencor  

Surfscan 4500 

List all items of this typeUnpatterned Wafer Inspection

in Surface Inspection

Tencor Surfscan 4500:

TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool

  • Cassette to Cassette Handling of 3” – 6” Wafers
  • New HeNe 2mW Laser, 632.8 nm Wavelength
  • New HeNe Laser Power Supply
  • 2 µ Particle Size Sensitivity
  • Automatic Calibration
  • Flatscreen Monitor
  • System Calibrated & Demonstrated
  • Calibration Standard Wafer Included
1 45,000.00
23995
Vision Engineering  

Vision Engineering  

Dynascope 

List all items of this typeMicroscopes - Other

in Optical Microscopes

Vision Engineering - Dynascope:
Projection Microscope
1  
245328
Zeiss  

Zeiss  

Smartzoom 5 

List all items of this typeMicroscopes - Other

in Optical Microscopes

Zeiss Smartzoom 5 Digital Microscope:

Zeiss Smartzoom 5 Digital Microscope

  • Zeiss Model D Tiltable Stand (G) Item No. 430040-9000-000
    • Motorized Z-Drives for Focusing & Pivot Point Adjustment
    • Tilting angle ≤ 45°
  • Zeiss Smartzoom 5 Optical Engine (G) Item No. 425525-9010-000 
    • Integrated 10x Zoom
    • Integrated Coaxial LED illumination
    • Integrated CMOS Camera
  • Zeiss 10X Plan Apo D Objective Part No. 435230-9040-000
    • NA = 0.6, FWD 10 mm
    • Integrated Segmented LED Illumination
    • Integrated Data Output on Magnification & Optical Correction Factors
  • Zeiss 1.6X Plan Apo Objective
    • NA = 0.1, FWD 36 mm
    • Integrated Segmented LED Illumination
    • Integrated Data Output on Magnification & Optical Correction Factors
  • Zeiss Scanning Stage D 130 X 100 STEP Item No. 432038-9000-000
    • Stage Flat Surface Area: 310 mm X 223 mm
    • XY Travel: 130 mm X 100 mm
    • Absolute Accuracy: +/- 5 µm
    • Reproducibility: ≤ 1 µm
    • Stepper Motor with 4 mm Spindle Pitch
    • Integrated Controller
    • Interchangeable Stage Inserts: 160 mm X 116 mm
    • Metal Stage Insert Included
  • Lenovo ThinkCentre All-in-One Control PC for Smartzoom 5 Item No. 432915-9105-000
    • Full HD 24” Display & Integrated PC with Windows 10
    • 2019 LTSC includes Smartzoom Acquisition
    • 2D/3D Measurement & Reporting Software with 3D/EDF (Extended Depth of Focus) Imaging
    • 3D/EDF Stitching & Job Mode with Individual Referencing Data, Configuration & System Calibration
1  


*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.